公开(公告)号：US08169608B2

公开(公告)日：2012-05-01

申请号：US13306941

申请日：2011-11-29

Applicant: Hiroyuki Sano ,  Makoto Okawauchi ,  Kosei Oshima ,  Kazuaki Ohkubo ,  Tsutomu Mizuguchi ,  Shiro Shima

Inventor： Hiroyuki Sano ,  Makoto Okawauchi ,  Kosei Oshima ,  Kazuaki Ohkubo ,  Tsutomu Mizuguchi ,  Shiro Shima

IPC: G01J3/28

CPC classification number: G01J3/02 ,  G01J1/0219 ,  G01J3/0232 ,  G01J3/28

Abstract: An optical characteristic measurement device includes a photodetector and a processor. The photodetector has a detection surface greater than a light incident surface receiving light from a spectrometer. The processor is configured to obtain a measurement spectrum detected in a first detection area corresponding to the light incident surface and a signal intensity detected in a second detection area different from the light incident surface, correct a pattern prepared in advance and exhibiting a noise characteristic of the photodetector based on the signal intensity to calculate a first correction spectrum, subtract a correction value calculated based on the signal intensity from each component value of the measurement spectrum to calculate a second correction spectrum, and subtract each component value of the first correction spectrum from a corresponding component value of the second correction spectrum to calculate an output spectrum.

Abstract translation: 光学特性测量装置包括光电检测器和处理器。 光电检测器具有大于接收来自光谱仪的光的光入射表面的检测表面。 处理器被配置为获得在与光入射面对应的第一检测区域中检测的测量光谱和在与光入射面不同的第二检测区域中检测的信号强度，校正预先准备的图案，并且显示噪声特性 光电检测器基于信号强度计算第一校正光谱，从每个测量光谱的分量值中减去基于信号强度计算的校正值，以计算第二校正光谱，并将第一校正光谱的每个分量值从 第二校正频谱的相应分量值来计算输出频谱。

公开(公告)号：US08169607B2

公开(公告)日：2012-05-01

申请号：US12573140

申请日：2009-10-04

Applicant: Hiroyuki Sano ,  Makoto Okawauchi ,  Kosei Oshima ,  Kazuaki Ohkubo ,  Tsutomu Mizuguchi ,  Shiro Shima

Inventor： Hiroyuki Sano ,  Makoto Okawauchi ,  Kosei Oshima ,  Kazuaki Ohkubo ,  Tsutomu Mizuguchi ,  Shiro Shima

IPC: G01J3/28

CPC classification number: G01J3/02 ,  G01J1/0219 ,  G01J3/0232 ,  G01J3/28

Abstract: A processing unit obtains a first spectrum detected in a first detection area and a first signal intensity detected in a second detection area after the light entering the housing is cut off, and then calculates a first correction spectrum by subtracting a first correction value calculated based on the first signal intensity from each component value of the first spectrum. The processing unit obtains a second spectrum detected in the first detection area and a second signal intensity detected in the second detection area while a cut-off portion is opened, and then calculates a second correction spectrum by subtracting a second correction value calculated based on the second signal intensity from each component value of the second spectrum. The processing unit calculates an output spectrum representing a measurement result by subtracting a corresponding component value of the first correction spectrum from each component value of the second correction spectrum.

Abstract translation: 处理单元获取在进入壳体的光被切断之后在第一检测区域中检测到的第一光谱和在第二检测区域中检测到的第一信号强度，然后通过减去基于 来自第一光谱的每个分量值的第一信号强度。 所述处理单元获取在所述第一检测区域中检测到的第二频谱和在所述第二检测区域中检测的第二信号强度，同时切断部分被打开，然后通过减去基于所述第二检测区域计算的第二校正值来计算第二校正频谱 来自第二光谱的每个分量值的第二信号强度。 处理单元通过从第二校正频谱的每个分量值中减去第一校正频谱的对应分量值来计算表示测量结果的输出频谱。

公开(公告)号：US20100091280A1

公开(公告)日：2010-04-15

申请号：US12573140

申请日：2009-10-04

Applicant: Hiroyuki SANO ,  Makoto Okawauchi ,  Kosei Oshima ,  Kazuaki Ohkubo ,  Tsutomu Mizuguchi ,  Shiro Shima

Inventor： Hiroyuki SANO ,  Makoto Okawauchi ,  Kosei Oshima ,  Kazuaki Ohkubo ,  Tsutomu Mizuguchi ,  Shiro Shima

IPC: G01J3/28

CPC classification number: G01J3/02 ,  G01J1/0219 ,  G01J3/0232 ,  G01J3/28

Abstract: A processing unit obtains a first spectrum detected in a first detection area and a first signal intensity detected in a second detection area after the light entering the housing is cut off, and then calculates a first correction spectrum by subtracting a first correction value calculated based on the first signal intensity from each component value of the first spectrum. The processing unit obtains a second spectrum detected in the first detection area and a second signal intensity detected in the second detection area while a cut-off portion is opened, and then calculates a second correction spectrum by subtracting a second correction value calculated based on the second signal intensity from each component value of the second spectrum. The processing unit calculates an output spectrum representing a measurement result by subtracting a corresponding component value of the first correction spectrum from each component value of the second correction spectrum.

Abstract translation: 处理单元获取在进入壳体的光被切断之后在第一检测区域中检测到的第一光谱和在第二检测区域中检测到的第一信号强度，然后通过减去基于 来自第一光谱的每个分量值的第一信号强度。 所述处理单元获取在所述第一检测区域中检测到的第二频谱和在所述第二检测区域中检测的第二信号强度，同时切断部分被打开，然后通过减去基于所述第二检测区域计算的第二校正值来计算第二校正频谱 来自第二光谱的每个分量值的第二信号强度。 处理单元通过从第二校正频谱的每个分量值中减去第一校正频谱的对应分量值来计算表示测量结果的输出频谱。

公开(公告)号：US20120075628A1

公开(公告)日：2012-03-29

申请号：US13306941

申请日：2011-11-29

Applicant: Hiroyuki SANO ,  Makoto OKAWAUCHI ,  Kosei OSHIMA ,  Kazuaki OHKUBO ,  Tsutomu MIZUGUCHI ,  Shiro SHIMA

Inventor： Hiroyuki SANO ,  Makoto OKAWAUCHI ,  Kosei OSHIMA ,  Kazuaki OHKUBO ,  Tsutomu MIZUGUCHI ,  Shiro SHIMA

IPC: G01J3/28

CPC classification number: G01J3/02 ,  G01J1/0219 ,  G01J3/0232 ,  G01J3/28

Abstract: An optical characteristic measurement device includes a photodetector and a processor. The photodetector has a detection surface greater than a light incident surface receiving light from a spectrometer. The processor is configured to obtain a measurement spectrum detected in a first detection area corresponding to the light incident surface and a signal intensity detected in a second detection area different from the light incident surface, correct a pattern prepared in advance and exhibiting a noise characteristic of the photodetector based on the signal intensity to calculate a first correction spectrum, subtract a correction value calculated based on the signal intensity from each component value of the measurement spectrum to calculate a second correction spectrum, and subtract each component value of the first correction spectrum from a corresponding component value of the second correction spectrum to calculate an output spectrum.

Abstract translation: 光学特性测量装置包括光电检测器和处理器。 光电检测器具有大于接收来自光谱仪的光的光入射表面的检测表面。 处理器被配置为获得在与光入射面对应的第一检测区域中检测的测量光谱和在与光入射面不同的第二检测区域中检测的信号强度，校正预先准备的图案，并且显示噪声特性 光电检测器基于信号强度计算第一校正光谱，从每个测量光谱的分量值中减去基于信号强度计算的校正值，以计算第二校正光谱，并将第一校正光谱的每个分量值从 第二校正频谱的相应分量值来计算输出频谱。