公开(公告)号：US11892414B2

公开(公告)日：2024-02-06

申请号：US17263818

申请日：2019-06-26

Applicant: VIEW-ON LTD.

Inventor： Young Yeop Yoon

IPC: G01N21/88 ,  G06T7/00

CPC classification number: G01N21/8806 ,  G01N21/8851 ,  G06T7/0006 ,  G01N2021/8835 ,  G01N2021/8887 ,  G01N2201/0626 ,  G06T2207/10152 ,  G06T2207/30136 ,  G06T2207/30141

Abstract: Proposed are a device and method for checking for a surface defect, using an image sensor. The device can increase accuracy in detecting defects of various types, shapes, or directions, and include: a frame part for providing a transport path of an object to be checked, along the lengthwise direction parallel to the ground surface; a transport part provided on one side of the frame part so as to transport the object to be checked, along the transport path; and an image sensor part provided in the middle of the transport path so as to capture an image of the surface of the object to be checked, from above the transported object to be checked.

公开(公告)号：US20210302324A1

公开(公告)日：2021-09-30

申请号：US17263818

申请日：2019-06-26

Applicant: VIEW-ON LTD.

Inventor： Young Yeop YOON

IPC: G01N21/88 ,  G06T7/00

Abstract: Proposed are a device and method for checking for a surface defect, using an image sensor. The device can increase accuracy in detecting defects of various types, shapes, or directions, and include: a frame part for providing a transport path of an object to be checked, along the lengthwise direction parallel to the ground surface; a transport part provided on one side of the frame part so as to transport the object to be checked, along the transport path; and an image sensor part provided in the middle of the transport path so as to capture an image of the surface of the object to be checked, from above the transported object to be checked.