TESTING METHOD FOR NON-INVASIVE TEMPERATURE MEASURING INSTRUMENTS

    公开(公告)号:US20220074798A1

    公开(公告)日:2022-03-10

    申请号:US17530597

    申请日:2021-11-19

    Applicant: ABB Schweiz AG

    Abstract: A method for testing a temperature measuring instrument is presented, where the instrument includes at least one sensor that changes its electrical resistance, and/or an electrical voltage that it produces, in response to being exposed to a change in temperature, and where the instrument is configured to be coupled to an object of interest. The method includes changing the temperature of at least one sensor by an amount that is detectable given the measurement resolution of the at least one sensor, by driving an electrical manipulation current through this sensor; obtaining one or measurement values from at least one sensor; and evaluating a state of the measuring instrument, a state of one or more of its sensors, and/or a state of a coupling to an object of interest, from the one or more measurement values.

    TEMPERATURE MEASURING DEVICE AND METHOD FOR DETERMINING TEMPERATURE

    公开(公告)号:US20200225096A1

    公开(公告)日:2020-07-16

    申请号:US16828979

    申请日:2020-03-25

    Applicant: ABB Schweiz AG

    Abstract: A temperature measuring device for determining a medium temperature by a temperature of a measuring point on a surface enclosing the medium includes: at least one measuring sensor; at least one reference sensor; and a measured value processing device which is connected via a cable to the at least one measuring sensor and via a cable to the at least one reference sensor. The at least one measuring sensor and the at least one reference sensor are arranged along a main thermal connection path between the surface enclosing the medium and surroundings. The at least one measuring sensor is arranged close to the measuring point. A thermal resistance between a relevant measuring sensor and the at least one reference sensor is smaller than a thermal resistance between a relevant reference sensor and the surroundings.

    Testing method for non-invasive temperature measuring instruments

    公开(公告)号:US11579026B2

    公开(公告)日:2023-02-14

    申请号:US17530597

    申请日:2021-11-19

    Applicant: ABB Schweiz AG

    Abstract: A method for testing a temperature measuring instrument is presented, where the instrument includes at least one sensor that changes its electrical resistance, and/or an electrical voltage that it produces, in response to being exposed to a change in temperature, and where the instrument is configured to be coupled to an object of interest. The method includes changing the temperature of at least one sensor by an amount that is detectable given the measurement resolution of the at least one sensor, by driving an electrical manipulation current through this sensor; obtaining one or measurement values from at least one sensor; and evaluating a state of the measuring instrument, a state of one or more of its sensors, and/or a state of a coupling to an object of interest, from the one or more measurement values.

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