公开(公告)号：US20150279020A1

公开(公告)日：2015-10-01

申请号：US14229649

申请日：2014-03-28

Applicant: Apple Inc.

Inventor： Nathan K. Gupta ,  Supriya Goyal ,  Veysi Demir ,  Patrick Kessler ,  Hyungryul J. Choi

IPC: G06T7/00

CPC classification number: G06T7/0004 ,  G06T2207/30121 ,  G09G3/006 ,  G09G2320/0693 ,  G09G2360/145

Abstract: A display characterization system may be used to gather display flatness data and light leakage data from a display. The display characterization system may include a camera system that includes flatness measurement cameras and a light leakage measurement camera. The camera system may include a light guide plate covered with a patterned opaque layer or other planar light-emitting structures for emitting patterned light that is reflected from the display. A controller may use the light leakage measurement camera to capture light leakage data while a display backlight unit is on, a reference light source is on, and the planar light-emitting structures are not emitting light. The controller may use the flatness measurement cameras to capture flatness data while the backlight unit is off, the reference light source is off, and the light-emitting structures are reflecting light from the display.

Abstract translation: 可以使用显示表征系统从显示器收集显示平坦度数据和漏光数据。 显示表征系统可以包括包括平坦度测量相机和漏光测量相机的照相机系统。 相机系统可以包括覆盖有图案化不透明层的导光板或用于发射从显示器反射的图案化光的其它平面发光结构。 控制器可以使用漏光测量相机来捕获漏光数据，同时显示背光单元打开，参考光源打开，并且平面发光结构不发光。 控制器可以使用平坦度测量相机来捕获平面度数据，同时背光单元关闭，参考光源关闭，并且发光结构反射来自显示器的光。