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公开(公告)号：US11971637B2
公开(公告)日：2024-04-30
申请号：US17474099
申请日：2021-09-14
申请人： Japan Display Inc.
发明人： Koji Yamamoto , Naoyuki Obinata , Kengo Shiragami
IPC分类号： G02F1/1362 , G02F1/1345 , G06T7/00 , G09F9/30 , G09G3/00 , G09G3/20
CPC分类号： G02F1/136286 , G02F1/13452 , G02F1/13458 , G02F1/136254 , G06T7/0004 , G09F9/30 , G09G3/006 , G09G3/2092 , G06T2207/30121 , G09G2300/0413
摘要： A display device includes wires that are coupled to driver terminals that are able to be coupled to a driver integrated circuit (IC) and that are provided along a first direction and extending so as to spread toward outsides in the first direction as the wires are directed toward a second direction orthogonal to the first direction; and dummy wires that are provided along the wires on one outside and another outside in the first direction of the wires and that are not coupled to the driver terminals and the wires, wherein a number of the dummy wires on the one outside and a number of the dummy wires on the other outside are respectively three or more, the dummy wires extend in parallel with the wires, and a width of the dummy wire is equal to a width of the wire.
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公开(公告)号：US20230326006A1
公开(公告)日：2023-10-12
申请号：US18042422
申请日：2021-08-25
申请人： GOERTEK INC.
发明人： Xiaoman WANG
CPC分类号： G06T7/0004 , G06T7/60 , G06T7/13 , G06T7/136 , G06T5/002 , G06T7/11 , G06T7/73 , G06F18/23 , G06T2207/30121 , G06T2207/20224
摘要： A defect detection method for an LCD screen includes acquiring a screen image of the LCD screen, performing a rough search for defects in the screen image to extract a suspected area where the defects are located, (based on the suspected area,) clustering every pixel point in the suspected area to obtain clustering results, and each clustering result corresponds to a suspected defect, and (according to the clustering result,) calculating a width and length of the suspected defect corresponding to the clustering result, and determining whether the suspected defect is a screen defect and which type of screen defect it belongs to based on the width and length of the suspected defect. The technical solution of the present disclosure realizes automatic detection of screen defects by rough positioning and accurate positioning of suspected defects, and the detection results are accurate and reliable.
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3.发明申请公开(公告)号：US20180033380A1
公开(公告)日：2018-02-01
申请号：US15654995
申请日：2017-07-20
发明人： Na An
CPC分类号： G09G3/3607 , G06T7/001 , G06T7/11 , G06T7/90 , G06T2207/30121 , G09G3/006 , G09G2320/0666 , G09G2320/0673
摘要： The embodiments of the present disclosure provide a method and apparatus for adjusting gray-scale chromatic aberration for a display panel, as well as a display device. The method comprises: inputting a data signal of a test picture to sub-pixels of the display panel, for causing the display panel to display the test picture; collecting optical parameters of respective regions in the test picture; comparing the optical parameter of each region in the test picture with an optical parameter of a standard picture; and adjusting the data signal inputted to the sub-pixels, such that a difference between the optical parameter of each region in the test picture and the optical parameter of the standard picture falls within a predetermined range. The optical parameter comprises a color coordinate and its corresponding brightness.
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公开(公告)号：US09800868B2
公开(公告)日：2017-10-24
申请号：US15171357
申请日：2016-06-02
发明人： Yanxue Wang , Lixuan Chen
CPC分类号： H04N17/004 , G06T7/0004 , G06T7/90 , G06T2207/10024 , G06T2207/20056 , G06T2207/30121
摘要： An image-sticking inspection method and a device. The method includes: after displaying a standard checkerboard image for a period of time, changing to an image having a specified grayscale value and capturing a residual image; respectively performing a fourier transformation to the standard checkerboard and residual image to obtain a first and a second energy spectrum; respectively transforming the first and the second energy spectrum to polar coordinate; for polar angles from 0 to 2π, summing values of each first and second energy spectrum in the polar coordinate to obtain a checkerboard and an image-sticking energy spectrum; obtaining a characteristic frequency corresponding to a maximum value of the checkerboard energy spectrum; obtaining a first and a second energy value respectively corresponding to the characteristic and a zero frequency of the image-sticking energy spectrum; and dividing the first energy value by the second energy value to obtain an image-sticking evaluation value.
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公开(公告)号：US20170271189A1
公开(公告)日：2017-09-21
申请号：US15291424
申请日：2016-10-12
发明人： Xin CHEN , Chao GAO , Qingyang YAO , Jianghua QI , Yujiang CHENG
CPC分类号： H01L21/68 , B25J9/1679 , G06K9/3216 , G06T7/70 , G06T7/74 , G06T2207/30121 , G06T2207/30204
摘要： The present disclosure provides a robot arm, including a pedestal, a support arm on the pedestal and configured to support a substrate, a driving system configured to drive the support arm to move, and a substrate alignment device connected to the support arm. The substrate alignment device includes a first position information collection unit configured to acquire first position information of the substrate when the substrate is on the support arm at a first position; a deviation information acquisition unit configured to acquire position deviation information of the substrate in accordance with the first position information and second position information of the substrate in the case that the substrate is located at a standard position, and an adjustment unit configured to generate control information in accordance with the position deviation information, thereby driving the support arm by the driving system to place the substrate at a target position.
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6.发明授权公开(公告)号：US09760985B2
公开(公告)日：2017-09-12
申请号：US14831929
申请日：2015-08-21
申请人： Ta-Jen Kuo
发明人： Ta-Jen Kuo , Ron Tsai
CPC分类号： G06T7/0004 , G06T7/0006 , G06T7/70 , G06T2207/30121 , G06T2207/30148
摘要： The present invention provides an apparatus for highly accurate and real-time photoelectric glass substrate identification. The apparatus includes: a laser device for emitting a laser beam; a glass substrate that has a first surface and a second surface and is configured to receive the laser beam to generate a first laser beam point and a second laser beam point; and, a charged coupled device (CCD) camera inspecting equipment. The first laser beam point has a first point area, and the second laser beam point has a second point area. Once the first point area is moved for a glass distance number and is aligned with the second point area, the CCD camera inspecting equipment can obtain a thickness value of the glass substrate with a resolution value and the glass distance number. In addition, the present invention also provides a method for highly accurate and real-time photoelectric glass substrate identification.
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7.发明申请公开(公告)号：US20170077461A1
公开(公告)日：2017-03-16
申请号：US15250283
申请日：2016-08-29
申请人： Kateeva, Inc.
发明人： Christopher Cocca
CPC分类号： H01L51/56 , G06T7/0004 , G06T7/0008 , G06T7/001 , G06T2207/10024 , G06T2207/20072 , G06T2207/30121 , H01L51/0004 , H01L51/0031
摘要： This disclosure provides techniques for assessing quality of a deposited film layer of an organic light emitting diode (“OLED”) device. An image is captured and filtered to identify a deposited layer that is to be analyzed. Image data representing this layer can be optionally converted to brightness (grayscale) data. A gradient function is then applied to emphasize discontinuities in the deposited layer. Discontinuities are then compared to one or more thresholds and used to ascertain quality of the deposited layer, with optional remedial measures then being applied. The disclosed techniques can be applied in situ, to quickly identify potential defects such as delamination before ensuing manufacturing steps are applied. In optional embodiments, remedial measures can be taken dependent on whether defects are determined to exist.
摘要翻译： 本公开提供了用于评估有机发光二极管（“OLED”）器件的沉积膜层的质量的技术。 拍摄和过滤图像以识别待分析的沉积层。 可以将代表该层的图像数据转换为亮度（灰度）数据。 然后应用梯度函数来强调沉积层中的不连续性。 然后将不连续性与一个或多个阈值进行比较，并用于确定沉积层的质量，然后应用可选的补救措施。 所公开的技术可以原位应用，以便在应用制造步骤之前快速识别潜在的缺陷，例如分层。 在可选实施例中，可以取决于是否确定缺陷是否存在补救措施。
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公开(公告)号：US09549114B2
公开(公告)日：2017-01-17
申请号：US14250975
申请日：2014-04-11
发明人： Chih-Kuang Chang , Jia-Jia Chen , Zhong-Kui Yuan , Li Jiang , Dong-Hai Li , Xiao-Guang Xue
CPC分类号： H04N5/23212 , G06T7/0002 , G06T2207/10016 , G06T2207/30121
摘要： In a focus identification method for identifying different focuses of an object, discrete image data is acquired from captured images of an object. The images are captured by a charge coupled device (CCD) in motion of a measurement machine at a predetermined time period. The discrete image data includes definitions of the images and Z-coordinates of the CCD when capturing the images. Maxima and minima of the discrete image data are computed to establish intervals within the discrete image data. The intervals are selected one by one, and a curve is fitted according to the discrete image data at the selected interval. A peak value of the fitted curve is computed as one of focuses of the object when a goodness of fit of the fitted curve meets a predetermined criterion.
摘要翻译： 在用于识别对象的不同焦点的焦点识别方法中，从对象的拍摄图像获取离散图像数据。 在预定的时间周期内，由测量机运动的电荷耦合器件（CCD）捕获图像。 离散图像数据包括捕获图像时CCD的图像和Z坐标的定义。 计算离散图像数据的最大值和最小值以建立离散图像数据内的间隔。 逐个选择间隔，并根据离散图像数据以所选间隔拟合曲线。 当拟合曲线的拟合优度符合预定标准时，拟合曲线的峰值被计算为对象的焦点之一。
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9.发明申请DEFECT DETECTION METHOD FOR DISPLAY PANEL BASED ON HISTOGRAM OF ORIENTED GRADIENT 有权基于面向梯度组合显示面板的缺陷检测方法公开(公告)号：US20160364849A1
公开(公告)日：2016-12-15
申请号：US14417094
申请日：2014-11-18
发明人： Xiaole Liu , Jingbo Li
CPC分类号： G06T7/001 , G06K9/4671 , G06T7/0004 , G06T2207/20081 , G06T2207/30121
摘要： In order to detect defects in display panels by an automatic way accurately and quickly, the present invention proposes a method combining image feature extraction and classifier model. It calculates the histograms of oriented gradient (HOG) of images of the display panel collected by an industrial camera of a detection apparatus as feature vectors. Then use them as input samples to train the classifier model to recognize the defects of the display panel.
摘要翻译： 为了通过自动方式准确快速地检测显示面板中的缺陷，本发明提出了一种组合图像特征提取和分类器模型的方法。 它计算由检测装置的工业相机收集的显示面板的图像的定向梯度（HOG）的直方图作为特征向量。 然后使用它们作为输入样本来训练分类器模型来识别显示面板的缺陷。
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公开(公告)号：US09424792B2
公开(公告)日：2016-08-23
申请号：US14389031
申请日：2013-09-17
发明人： Ming Li , Jongseok Jang , Yong Sub Kim , Xiaotao Liu
CPC分类号： G09G3/3648 , G06T7/001 , G06T2207/30121 , G09G3/006 , G09G3/3677 , G09G2310/0202
摘要： A test method for line defect in a display panel (10) comprises: inputting a first ON signal and a first OFF signal into odd rows of gate scanning lines (GE12) and even rows of gate scanning lines (GS13) of the display panel (10) respectively, to turn on transistors controlled by the odd rows of gate scanning lines (GE12), and turn off transistors controlled by the even rows of gate scanning lines (GS13), thereby obtaining a first test image; inputting a second OFF signal and a second ON signal into the odd rows of gate scanning lines (GE12) and even rows of gate scanning lines (GS13) of the display panel (10) respectively, to turn off the transistors controlled by the odd rows of gate scanning lines (GE12), and turn on the transistors controlled by the even rows of gate scanning lines (GE13), thereby obtaining a second test image; comparing the first test image with the second test image to determine that line display defect appearing in the first test image or the second test image are true display defect. Also is disclosed a test device for line defect in a display panel (10). This method allows the test result to approach the lighting test result under module signal input state and can detect true defect of the display panel (10).
摘要翻译： 一种显示面板（10）中的线缺陷的测试方法，包括：将第一ON信号和第一OFF信号输入到奇数行的栅极扫描线（GE12）和偶数行的栅极扫描线（GS13） 10）分别导通由奇数行的栅极扫描线（GE12）控制的晶体管，并关闭由栅极扫描线（GS13）的偶数行控制的晶体管，从而获得第一测试图像; 将第二OFF信号和第二ON信号分别输入到显示面板（10）的栅极扫描线（GE12）和偶数行栅极扫描线（GS13）的奇数行中，以关闭由奇数行控制的晶体管 的栅极扫描线（GE12），并接通由栅极扫描线（GE13）的偶数行控制的晶体管，从而获得第二测试图像; 将第一测试图像与第二测试图像进行比较，以确定出现在第一测试图像或第二测试图像中的线显示缺陷是真实显示缺陷。 还公开了一种用于显示面板（10）中的线路缺陷的测试装置。 该方法允许测试结果在模块信号输入状态下接近照明测试结果，并可以检测显示面板（10）的真实缺陷。
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