DRY ETCHING METHOD
    5.
    发明申请
    DRY ETCHING METHOD 审中-公开

    公开(公告)号:US20190080928A1

    公开(公告)日:2019-03-14

    申请号:US16108185

    申请日:2018-08-22

    Abstract: A dry etching method, including: etching a silicon-containing thin film with a first gas by a first preset thickness; etching the silicon-containing thin film with a second gas by a second preset thickness, to remove etching residues generated after etching the silicon-containing thin film by the first preset thickness; after the etching residues are removed, etching the silicon-containing thin film with the first gas by a third preset thickness, which is less than the first preset thickness; wherein the first gas includes chlorine gas, and the second gas includes fluoride gas.

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