公开(公告)号：US20190299251A1

公开(公告)日：2019-10-03

申请号：US16443931

申请日：2019-06-18

申请人： Chao Chen ,  Kailiang Chen ,  Leung Kin Chiu ,  Youn-Jae Kook ,  Keith G. Fife

发明人： Chao Chen ,  Kailiang Chen ,  Leung Kin Chiu ,  Youn-Jae Kook ,  Keith G. Fife

IPC分类号： B06B1/02 ,  H03M3/00

摘要： Aspects of technology described herein relate to ultrasound apparatuses including capacitive micromachines ultrasonic transducers (CMUTs) that are directly electrically coupled to delta-sigma analog-to-digital converters (ADCs). The apparatus may lack an amplifier or multiplexer between each CMUT and delta-sigma ADC. The apparatus may include between 100 and 20,000 CMUTs and between 100 and 20,000 delta-sigma ADCs, each of the CMUTs directly electrically coupled to one of the delta-sigma ADCs. The CMUTs and the delta-sigma ADCs may be monolithically integrated on a single substrate. The delta-sigma ADCs may lack an integrator distinct from the CMUT. An internal capacitance of the CMUT may serve as an integrator for the delta-sigma ADC.

公开(公告)号：US20210328564A1

公开(公告)日：2021-10-21

申请号：US17232088

申请日：2021-04-15

申请人： Chao Chen ,  Youn-Jae Kook ,  Jihee Lee ,  Kailiang Chen ,  Leung Kin Chiu ,  Joseph Lutsky ,  Nevada J. Sanchez ,  Sebastian Schaetz ,  Hamid Soleimani

发明人： Chao Chen ,  Youn-Jae Kook ,  Jihee Lee ,  Kailiang Chen ,  Leung Kin Chiu ,  Joseph Lutsky ,  Nevada J. Sanchez ,  Sebastian Schaetz ,  Hamid Soleimani

IPC分类号： H03F3/45 ,  H03F1/32 ,  H03K5/24 ,  H03M3/00 ,  A61B8/00

摘要： Aspects of the technology described herein relate to built-in self-testing (BIST) of circuitry (e.g., a pulser or receive circuitry) and/or transducers in an ultrasound device. A BIST circuit may include a transconductance amplifier coupled between a pulser and receive circuitry, a capacitor network coupled between a pulser and receive circuitry, and/or a current source couplable to the input terminal of receive circuitry to which a transducer is also couplable. The collapse voltages of transducers may be characterized using BIST circuitry, and a bias voltage may be applied to the membranes of the transducers based at least in part on their collapse voltages. The capacitances of transducers may also be measured using BIST circuitry and a notification may be generated based on the sets of measurements.

公开(公告)号：US20210325349A1

公开(公告)日：2021-10-21

申请号：US17232100

申请日：2021-04-15

申请人： Chao Chen ,  Youn-Jae Kook ,  Jihee Lee ,  Kailiang Chen ,  Leung Kin Chiu ,  Joseph Lutsky ,  Nevada J. Sanchez ,  Sebastian Schaetz ,  Hamid Soleimani

发明人： Chao Chen ,  Youn-Jae Kook ,  Jihee Lee ,  Kailiang Chen ,  Leung Kin Chiu ,  Joseph Lutsky ,  Nevada J. Sanchez ,  Sebastian Schaetz ,  Hamid Soleimani

IPC分类号： G01N29/24 ,  B06B1/02 ,  G01S15/89 ,  G01S7/52

摘要： Aspects of the technology described herein relate to built-in self-testing (BIST) of circuitry (e.g., a pulser or receive circuitry) and/or transducers in an ultrasound device. A BIST circuit may include a transconductance amplifier coupled between a pulser and receive circuitry, a capacitor network coupled between a pulser and receive circuitry, and/or a current source couplable to the input terminal of receive circuitry to which a transducer is also couplable. The collapse voltages of transducers may be characterized using BIST circuitry, and a bias voltage may be applied to the membranes of the transducers based at least in part on their collapse voltages. The capacitances of transducers may also be measured using BIST circuitry and a notification may be generated based on the sets of measurements.