Manufacturing method of semiconductor device
    1.
    发明授权
    Manufacturing method of semiconductor device 有权
    半导体器件的制造方法

    公开(公告)号:US08728923B2

    公开(公告)日:2014-05-20

    申请号:US13626072

    申请日:2012-09-25

    Abstract: A manufacturing method of a semiconductor device having an ohmic electrode is disclosed. The manufacturing method includes: forming a metal thin film on a rear surface of a semiconductor substrate; forming an ohmic electrode by laser annealing by irradiating the metal thin film with laser beam; and dicing the semiconductor substrate into chips by cutting at a dicing region of the semiconductor substrate. In forming the ohmic electrode, laser irradiation of the metal thin film is performed on a chip-by-chip basis while the dicing region is not being irradiated with the laser beam.

    Abstract translation: 公开了一种具有欧姆电极的半导体器件的制造方法。 制造方法包括:在半导体衬底的后表面上形成金属薄膜; 通过用激光束照射金属薄膜通过激光退火形成欧姆电极; 并且通过在半导体衬底的切割区域切割将半导体衬底切割成芯片。 在形成欧姆电极时,金属薄膜的激光照射是在逐个芯片的基础上进行的,而切割区域不被激光束照射。

    MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
    2.
    发明申请
    MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE 有权
    半导体器件的制造方法

    公开(公告)号:US20130102127A1

    公开(公告)日:2013-04-25

    申请号:US13626072

    申请日:2012-09-25

    Abstract: A manufacturing method of a semiconductor device having an ohmic electrode is disclosed. The manufacturing method includes: forming a metal thin film on a rear surface of a semiconductor substrate; forming an ohmic electrode by laser annealing by irradiating the metal thin film with laser beam; and dicing the semiconductor substrate into chips by cutting at a dicing region of the semiconductor substrate. In forming the ohmic electrode, laser irradiation of the metal thin film is performed on a chip-by-chip basis while the dicing region is not being irradiated with the laser beam.

    Abstract translation: 公开了一种具有欧姆电极的半导体器件的制造方法。 制造方法包括:在半导体衬底的后表面上形成金属薄膜; 通过用激光束照射金属薄膜通过激光退火形成欧姆电极; 并且通过在半导体衬底的切割区域切割将半导体衬底切割成芯片。 在形成欧姆电极时,金属薄膜的激光照射是在逐个芯片的基础上进行的,而切割区域不被激光束照射。

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