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公开(公告)号：US20140178853A1
公开(公告)日：2014-06-26
申请号：US13725091
申请日：2012-12-21
Applicant: GENERAL ELECTRIC COMPANY
Inventor： Daniel Scott Groninger , Robert Carroll Ward , Francois Xavier de Fromont , Chad Martin Shaffer
IPC: G09B5/00
Abstract: A testing system for use in conducting testing of a structure, and a method for configuring a testing system are provided. The testing system includes a testing device that includes a presentation interface, a user input interface, a memory device and a processor coupled in communication with the presentation interface, the user input interface, and the memory device. The processor causes the testing device to present to a user, prior to a test session, at least one demonstrative instruction for conducting a test session using the testing device, and at least one test instruction for use while the user is conducting a test session using the device.
Abstract translation: 提供了一种用于进行结构测试的测试系统和一种用于配置测试系统的方法。 测试系统包括测试设备，该测试设备包括呈现界面，用户输入接口，存储设备和与显示界面，用户输入接口和存储设备通信耦合的处理器。 处理器使得测试设备在测试会话之前呈现给用户至少一个用于使用测试设备进行测试会话的演示指令，以及至少一个用于在用户正在进行测试会话期间使用的测试指令 装置。
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公开(公告)号：US09881510B2
公开(公告)日：2018-01-30
申请号：US13725091
申请日：2012-12-21
Applicant: General Electric Company
Inventor： Daniel Scott Groninger , Robert Carroll Ward , Francois Xavier de Fromont , Chad Martin Shaffer
Abstract: A testing system for use in conducting testing of a structure, and a method for configuring a testing system are provided. The testing system includes a testing device that includes a presentation interface, a user input interface, a memory device and a processor coupled in communication with the presentation interface, the user input interface, and the memory device. The processor causes the testing device to present to a user, prior to a test session, at least one demonstrative instruction for conducting a test session using the testing device, and at least one test instruction for use while the user is conducting a test session using the device.
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