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    Methods to reduce flashes on electrodes
    1.
    发明授权
    Methods to reduce flashes on electrodes 有权

    公开(公告)号：US12296162B2

    公开(公告)日：2025-05-13

    申请号：US17595169

    申请日：2020-05-07

    Applicant: GALVANI BIOELECTRONICS LIMITED ,  Cindy Au

    Inventor： Cindy Au

    IPC: A61N1/05 ,  B29C45/14 ,  B29C45/16 ,  B29K83/00 ,  B29L31/00

    Abstract: A method for use in making an electrode assembly (20) comprises the steps of applying an electrode (24) on a first layer of material (22); laser welding a lead (23) to the electrode; applying an adhesive backfill (26) over the electrode and the lead; and applying a second layer of material (28) over the adhesive backfill and a portion of the first layer to prevent a leakage path between the electrode and the second layer.

    Charger
    2.
    外观设计
    Charger 有权

    公开(公告)号：USD994597S1

    公开(公告)日：2023-08-08

    申请号：US29826951

    申请日：2022-02-16

    Applicant: Galvani Bioelectronics Limited

    Designer： Jay Canham ,  David Lari ,  Cindy Au ,  Melissa Lara ,  Daniel Nobre ,  Ryan Jongwoo Choi

    Abstract: FIG. 1 is a top perspective view of a charger;
    FIG. 2 is a bottom perspective view thereof;
    FIG. 3 is top plan view thereof;
    FIG. 4 is a bottom plan view thereof;
    FIG. 5 is a front elevation view thereof;
    FIG. 6 is a right side elevation view thereof;
    FIG. 7 is a left side elevation view thereof; and,
    FIG. 8 is a rear elevation view thereof.
    The broken lines in the drawings are for the purpose of illustrating portions of the charger that form no part of the claimed design.

    Charger
    3.
    外观设计
    Charger 有权

    公开(公告)号：USD994596S1

    公开(公告)日：2023-08-08

    申请号：US29826940

    申请日：2022-02-16

    Applicant: Galvani Bioelectronics Limited

    Designer： Jay Canham ,  David Lari ,  Cindy Au ,  Melissa Lara ,  Daniel Nobre ,  Ryan Jongwoo Choi

    Abstract: FIG. 1 is a top perspective view of a charger;
    FIG. 2 is a bottom perspective view thereof;
    FIG. 3 is top plan view thereof;
    FIG. 4 is a bottom plan view thereof;
    FIG. 5 is a front elevation view thereof;
    FIG. 6 is a right side elevation view thereof;
    FIG. 7 is a left side elevation view thereof; and,
    FIG. 8 is a rear elevation view thereof.
    The broken lines in the drawings are for the purpose of illustrating portions of the charger that form no part of the claimed design.

    NEURAL INTERFACE SYSTEM
    4.
    发明申请
    NEURAL INTERFACE SYSTEM 有权

    公开(公告)号：US20230009490A1

    公开(公告)日：2023-01-12

    申请号：US17780214

    申请日：2020-11-27

    Applicant: Galvani Bioelectronics Limited

    Inventor： Sebastien Ouchouche ,  Cindy Au ,  Kenneth Douglas Rys ,  Thomas Burge

    IPC: A61N1/05

    Abstract: An implantable neural interface system comprising: at least one electrode; a spine providing a passage for electrical conductors connectable to a pulse generator and the at least one electrode; at least one arm extending from the spine, wherein the electrode is positioned on the arm; and a strain relief feature configured to reduce strain in relative movement of portions of neural interface system to accommodate a curvature in an axis of a target on or in which the neural interface is provided.

    Charger
    6.
    外观设计
    Charger 有权

    公开(公告)号：USD994595S1

    公开(公告)日：2023-08-08

    申请号：US29826935

    申请日：2022-02-16

    Applicant: Galvani Bioelectronics Limited

    Designer： Jay Canham ,  David Lari ,  Cindy Au ,  Melissa Lara ,  Daniel Nobre ,  Ryan Jongwoo Choi

    Abstract: FIG. 1 is a top perspective view of a charger;
    FIG. 2 is a bottom perspective view thereof;
    FIG. 3 is top plan view thereof;
    FIG. 4 is a bottom plan view thereof;
    FIG. 5 is a front elevation view thereof;
    FIG. 6 is a right side elevation view thereof;
    FIG. 7 is a left side elevation view thereof; and,
    FIG. 8 is a rear elevation view thereof.
    The broken lines in the drawings are for the purpose of illustrating portions of the charger that form no part of the claimed design.

    Non-destructive test fixture for screening electrical continuity
    7.
    发明授权
    Non-destructive test fixture for screening electrical continuity 有权

    公开(公告)号：US12050253B2

    公开(公告)日：2024-07-30

    申请号：US17594924

    申请日：2020-05-01

    Applicant: GALVANI BIOELECTRONICS LIMITED

    Inventor： Ellen Kaplan ,  Cindy Au ,  Pey-Jiun Ko

    IPC: G01R31/08 ,  G01R1/067 ,  G01R31/54 ,  A61N1/05

    CPC classification number: G01R31/54 ,  G01R1/06705 ,  G01R1/06794 ,  A61N1/0553 ,  A61N1/0556

    Abstract: A test fixture (20) for testing continuity in at least one electrode of a neuromodulation device. The test fixture may comprise a substrate (22), at least one electrically conductive pad (24a) disposed on the substrate for reducing pressure applied to the at least one electrode when the electrically conductive pad makes contact with an exposed surface of the electrode, and a wire (26a) extending from the at least one electrically conductive pad. The pad may be formed of a non-abrasive material, such as conductive foam or smooth metal. The substrate may be a probe formed with a number of slots for holding pads and routing wires, a mandrel with openings for holding pads and routing wires, and a flexible circuit with exposed smooth metal surfaces. The test fixture may be suitable for testing cuff-like and paddle-like devices.

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