公开(公告)号：US20180108178A1

公开(公告)日：2018-04-19

申请号：US15292634

申请日：2016-10-13

申请人： General Electric Company

发明人： Sundar Murugappan ,  Arvind Rangarajan ,  Joseph William Bolinger ,  Francesco Balsamo ,  Lorenzo Bianchi

IPC分类号： G06T19/00 ,  G05B15/02 ,  G01B11/00

CPC分类号： G06T19/006 ,  B25J19/021 ,  G01B11/002 ,  G01B21/047 ,  G01B2210/58 ,  G01C11/00 ,  G01C15/002 ,  G01S5/163 ,  G01S17/06 ,  G01S17/66 ,  G05B15/02 ,  G06F17/50 ,  G06T7/0004

摘要： A method for inspecting a component includes generating measurement data of the component, using a measurement device coupled to an optical marker device. The method further includes generating co-ordinate data of the measurement device, using the optical marker device and at least one camera. The method includes generating synchronized measurement data based on the measurement data and the co-ordinate data. The method further includes retrieving pre-stored data corresponding to the synchronized measurement data, from a database. The method also includes generating feedback data based on the pre-stored data and the synchronized measurement data, using an augmented reality technique. The method includes operating the measurement device based on the feedback data to perform one or more measurements to be acquired from the component.