公开(公告)号：US20150227132A1

公开(公告)日：2015-08-13

申请号：US14422657

申请日：2013-08-07

申请人： HEXAGON METROLOGY S.P.A.

发明人： Roland Graf ,  Marco Forneris

IPC分类号： G05B19/402

CPC分类号： G05B19/402 ,  B62D65/024 ,  G01B11/002 ,  G01B21/047 ,  G05B2219/35162

摘要： The invention pertains to a reference positioning system for positioning a workpiece in a three-dimensional coordinate system, the reference positioning system comprising a first positioning unit for positioning a first alignment feature of the workpiece in a first dimension, in a second dimension and in a third dimension, comprising a first centring pin and a first reference level locator, a second positioning unit for positioning a second alignment feature of the workpiece in the second dimension and in the third dimension, comprising a second centring pin and a second reference level locator, and a third positioning unit for positioning a third alignment feature of the workpiece in the third dimension, comprising a third reference level locator.

摘要翻译： 本发明涉及用于将工件定位在三维坐标系中的参考定位系统，该参考定位系统包括第一定位单元，该第一定位单元用于将工件的第一对准特征定位在第一维度，第二维度和 第三尺寸，包括第一定心销和第一参考水平定位器，第二定位单元，用于在第二尺寸和第三维度中定位工件的第二对准特征，包括第二定心销和第二参考水平定位器， 以及第三定位单元，用于将所述工件的第三对准特征定位在所述第三维度中，包括第三参考水平定位器。

公开(公告)号：US10007250B2

公开(公告)日：2018-06-26

申请号：US14422657

申请日：2013-08-07

申请人： HEXAGON METROLOGY S.P.A.

发明人： Roland Graf ,  Marco Forneris

IPC分类号： G05B19/402 ,  B62D65/02 ,  G01B21/04 ,  G01B11/00

CPC分类号： G05B19/402 ,  B62D65/024 ,  G01B11/002 ,  G01B21/047 ,  G05B2219/35162

摘要： The invention pertains to a reference positioning system for positioning a workpiece in a three-dimensional coordinate system, the reference positioning system comprising a first positioning unit for positioning a first alignment feature of the workpiece in a first dimension, in a second dimension and in a third dimension, comprising a first centring pin and a first reference level locator, a second positioning unit for positioning a second alignment feature of the workpiece in the second dimension and in the third dimension, comprising a second centring pin and a second reference level locator, and a third positioning unit for positioning a third alignment feature of the workpiece in the third dimension, comprising a third reference level locator.