摘要:
The purpose is to remove surface-defective layer existing on the surface of an anode on a CCM substrate, protect the anode surface, prevent a drive voltage of an organic EL element from rising, and maintain uniformity of luminescence. On a substrate (12) a CCM layer (14) for converting light wavelength is formed. On the CCM layer (14) an anode (16) of IZO is formed. On the anode (16) a surface protective layer (18) containing an inorganic compound is formed by an inductively coupled RF plasma support magnetron sputtering. A preferable inorganic compound is SiO2. The surface defective layer of the anode (16) can be removed by the sputtering and the state of being removed can be held by the inorganic compound. Therefore the electrical stability of the anode (16) can be maintained for a long time, thereby improving the display quality of an organic EL display (100).
摘要:
An organic EL element comprising; an anode, a cathode, and an organic layer sandwiched therebetween containing at least an emitting layer, wherein a ratio, [In3d5/2]h/[In3d5/2]n, is from 0.9 to 1.2 wherein [In3d5/2]h is the half band width of a spectral peak derived from a 3d5/2 orbit of an In atom in the surface of the anode, and [In3d5/2]n is the half band width of a spectral peak derived from a 3d5/2 orbit of an In atom in the interior of the anode, the spectral peaks being measured by X-ray photoelectron spectroscopy (XPS): and the method for the production thereof.
摘要翻译:一种有机EL元件,包括: 阳极,阴极和夹在其间的至少一个发光层的有机层,其中比例为[In 3/2 5/2 N] / [In 3 d& 5/2 N n为0.9至1.2,其中[In 3 d 5/2/2] h H是半波长宽度 衍射自阳极表面中的In原子的3d 5/2 /轨道的光谱峰和[In3d5 / 2] N SUB 是源自阳极内部的In原子的3d 5/2轨道的光谱峰的半带宽,通过X射线光电子能谱(XPS)测量光谱峰, :及其生产方法。
摘要:
An organic EL element comprising; an anode, a cathode, and an organic layer sandwiched therebetween containing at least an emitting layer, wherein a ratio, [In3d5/2]h/[In3d5/2]n, is from 0.9 to 1.2 wherein [In3d5/2]h is the half band width of a spectral peak derived from a 3d5/2 orbit of an In atom in the surface of the anode, and [In3d5/2]n is the half band width of a spectral peak derived from a 3d5/2 orbit of an In atom in the interior of the anode, the spectral peaks being measured by X-ray photoelectron spectroscopy (XPS): and the method for the production thereof.
摘要翻译:一种有机EL元件,包括: 阳极,阴极和夹在其间的至少一个发光层的有机层,其中比例为[In 3/2 5/2 N] / [In 3 d& 5/2 N n为0.9至1.2,其中[In 3 d 5/2/2] h H是半波长宽度 衍射自阳极表面中的In原子的3d 5/2 /轨道的光谱峰和[In3d5 / 2] N SUB 是源于阳极内部的In原子的3d 5/2轨道的光谱峰的半带宽,通过X射线光电子能谱(XPS)测量光谱峰, :及其生产方法。
摘要:
An electrode substrate comprising; an electrode comprising a compound containing an In atom and a substrate body, wherein a half band width ratio [In3d5/2]h/[In3d5/2]n is from 0.9 to 1.2 wherein [In3d5/2]h is a half band width of a 3d5/2 orbit spectral peak of an In atom in the surface of the electrode, and [In3d5/2]n is a half band width of a 3d5/2 orbit spectral peak of an In atom in the interior of the electrode, the spectral peaks being measured by X-ray photoelectron spectroscopy: and the method for the production thereof.
摘要翻译:一种电极基板,包括: 包含含有In原子和底物的化合物的电极,其中半带宽比[In 3 d 5/2/2] / [In 3 d 5/2 其中[In 3 d 5/2/2] h是3d的一半带宽(SUB) 在电极表面中的In原子的5/2 / 2的轨道光谱峰,并且[In 3 d 5/2 N] N N是半波段宽度 在电极内部的In原子的3d5 / 2/2轨道光谱峰,通过X射线光电子能谱测量的光谱峰及其制造方法。
摘要:
An organic EL element comprising: an anode, a cathode, and an organic layer sandwiched therebetween containing at least an emitting layer, wherein a ratio, [In3d5/2]h/[In3d5/2]n, is from 0.9 to 1.2 wherein [In3d5/2]h is the half band width of a spectral peak derived from a 3d5/2 orbit of an In atom in the surface of the anode, and [In3d5/2]n is the half band width of a spectral peak derived from a 3d5/2 orbit of an In atom in the interior of the anode, the spectral peaks being measured by X-ray photoelectron spectroscopy (XPS): and the method for the production thereof.
摘要:
An organic electroluminescent device including a lower electrode, an organic light-emission medium, and an upper electrode on a support substrate, wherein the water content of the organic light-emission medium does not exceed 0.05 wt. %. By so controlling the water content of the organic light-emission medium, it is possible to prevent shrinkage of a light-emission area based on production of non-emission parts or non-emission spots for a long time at both high temperature and room temperature conditions. A method of making the organic electroluminescent device is disclosed also.
摘要:
The present invention concerns a method of forming one or more thin films on a substrate by depositing two or more materials by vacuum evaporation, comprising, depositing each material under such control that ni value of the each material is k±0.5 wherein k is a constant from 2 to 5, when relationship between a deposition position and a film thickness of a material i on the substrate is approximated by the following equation (1): Di/D0i∝(L0/Li)3cosniθi (1) wherein L0 is a distance from an evaporation source to a plane of the substrate in a perpendicular direction, D0i is a film thickness of the material i at an intersection point of a perpendicular line from the evaporation source to the plane of the substrate, and Di is a film thickness of the material i at a position on the substrate which is apart from the evaporation source by a distance Li in a direction of an angle θi against the perpendicular line. By the method, a homogenous thin film layer for an element can be formed even on a substrate having large screen.
摘要:
The present invention concerns a method of forming one or more thin films on a substrate by depositing two or more materials by vacuum evaporation, comprising, depositing each material under such control that ni value of the each material is k±0.5 wherein k is a constant from 2 to 5, when relationship between a deposition position and a film thickness of a material i on the substrate is approximated by the following equation (1): Di/D0i∝(L0/Li)3 cosni&thgr;i (1) wherein L0 is a distance from an evaporation source to a plane of the substrate in a perpendicular direction, D0i is a film thickness of the material i at an intersection point of a perpendicular line from the evaporation source to the plane of the substrate, and Di is a film thickness of the material i at a position on the substrate which is apart from the evaporation source by a distance Li in a direction of an angle &thgr;i against the perpendicular line. By the method, a homogenous thin film layer for an element can be formed even on a substrate having large screen.