公开(公告)号：USD851151S1

公开(公告)日：2019-06-11

申请号：US29634686

申请日：2018-01-24

Applicant: Hitachi High-Tech Science Corporation

Designer： Ai Masuda ,  Hiroyuki Noda ,  Hiroyuki Suzuki ,  Yasutaka Otsuka

公开(公告)号：US09810649B2

公开(公告)日：2017-11-07

申请号：US14956370

申请日：2015-12-01

Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION

Inventor： Toshiyuki Takahara ,  Hiroyuki Noda ,  Ai Masuda

IPC: G01N23/22 ,  G01N23/207 ,  G01N23/223 ,  G21F3/00

CPC classification number: G01N23/223 ,  G01N2223/076 ,  G01N2223/30 ,  G01N2223/6113 ,  G21F3/00

Abstract: An X-ray fluorescence analyzer includes: a sample stage having a mounting surface on which a sample on which a sample is mounted is mounted; an X-ray source configured to irradiate the sample with primary X-rays and disposed immediately above an irradiation position of the sample; a detector configured to detect fluorescent X-rays emitted from the sample irradiated with the primary X-rays; and a shielding container configured to accommodate the sample stage, the X-ray source, and the detector and includes: a sample chamber configured to accommodate the sample stage; and a door provided at a top of the sample chamber and configured to open and close at least a front half of the sample chamber, wherein the X-ray source and the detector are disposed at a rear half of the sample chamber.

公开(公告)号：USD781424S1

公开(公告)日：2017-03-14

申请号：US29529941

申请日：2015-06-11

Applicant: Hitachi High-Tech Science Corporation

Designer： Ai Masuda ,  Hiroyuki Noda ,  Toshiyuki Takahara ,  Ryouei Nozawa ,  Isao Yagi

公开(公告)号：USD780927S1

公开(公告)日：2017-03-07

申请号：US29529938

申请日：2015-06-11

Applicant: Hitachi High-Tech Science Corporation

Designer： Ai Masuda ,  Hiroyuki Noda ,  Toshiyuki Takahara ,  Isao Yagi