PLASMONIC PROJECTED DIFFRACTION SENSOR
    1.
    发明申请
    PLASMONIC PROJECTED DIFFRACTION SENSOR 审中-公开
    PLASMONIC投影衍射传感器

    公开(公告)号:US20150377780A1

    公开(公告)日:2015-12-31

    申请号:US14766551

    申请日:2013-12-03

    CPC classification number: G01N21/554 G01N21/4788 G01N21/553 G01N2201/062

    Abstract: A device for detecting an analyte includes a light source emitting substantially monochromatic light; a two-dimensional diffraction element that interacts with the light from the light source, the diffraction element having one or more features that can generate plasmon waves upon receipt of the light from the light source, at least some of the features being configured to interact with the analyte; and a two-dimensional image sensor facing the diffraction element to receive diffracted light from the diffraction element so as to detect a diffraction pattern projected thereto and to measure a two-dimensional spatial change in the diffraction pattern that occurs as a result of the analyte interacting with the feature of the diffraction element.

    Abstract translation: 用于检测分析物的装置包括发射基本单色光的光源; 与来自光源的光相互作用的二维衍射元件,所述衍射元件具有一个或多个特征,其在从光源接收到光时可产生等离子体波,所述特征中的至少一些被配置为与 分析物; 以及面向衍射元件的二维图像传感器,以从衍射元件接收衍射光,以便检测投影到其上的衍射图案,并测量作为分析物相互作用的结果发生的衍射图案的二维空间变化 具有衍射元件的特征。

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