公开(公告)号：US20250137944A1

公开(公告)日：2025-05-01

申请号：US18923777

申请日：2024-10-23

Applicant: ISHIDA CO., LTD.

Inventor： Futoshi YURUGI ,  Kota TOMINAGA ,  Shojiro KITA ,  Satoshi ONDA

IPC: G01N23/18 ,  G01N23/04 ,  G01N23/083 ,  G01N33/02

Abstract: An X-ray inspection apparatus includes a conveying unit configured to convey an article, an irradiation unit configured to irradiate the article conveyed by the conveying unit with X-rays, a sensor unit in which detecting elements are arranged in a planar shape, an image generation unit configured to read detection results output from at least some of the detecting elements and generate an image, and a mode switching unit configured to switch an operation mode between a first mode in which a first electric power is supplied to the irradiation unit and a second mode in which a second electric power less than the first electric power is supplied to the irradiation unit, where the mode switching unit changes, when switching the operation mode from the first mode to the second mode, a read frequency at which the image generation unit reads the detection results.