TiW barrier metal process
    1.
    发明授权
    TiW barrier metal process 失效
    TiW阻隔金属工艺

    公开(公告)号:US5290588A

    公开(公告)日:1994-03-01

    申请号:US812244

    申请日:1991-12-19

    摘要: An improved process is provided for forming a multilayer structure (18) suitable for tape automated bonding thereto or for forming contacts. In the process, a first layer (12) of aluminum is formed on a substrate (10), a second layer (14) of a TiW alloy is formed on the first layer of aluminum, and a third layer (16) of gold is formed on the second layer of the TiW alloy, to which third layer of gold bonding is done. The improvement comprises annealing the second layer of the TiW alloy in an inert atmosphere at a temperature less than about 500.degree. C. for a period of time sufficient to form a film of an Al--TiW phase (20), believed to comprise TiAl.sub.3, at the interface between the first layer of aluminum and the second layer of the TiW alloy. The annealing is done prior to forming the third layer of gold on the second layer of the TiW alloy.

    摘要翻译: 提供了一种改进的方法,用于形成适于胶带自动粘合或用于形成接触的多层结构(18)。 在该方法中,在基板(10)上形成铝的第一层(12),在第一层铝上形成TiW合金的第二层(14),并且金的第三层(16)为 形成在TiW合金的第二层上,进行第三层金键合。 该改进包括在惰性气氛中在小于约500℃的温度下退火TiW合金的第二层足够长的时间以形成被认为包含TiAl 3的Al-TiW相(20)的膜, 在第一层铝和第二层TiW合金之间的界面处。 在TiW合金的第二层上形成第三层金之前进行退火。