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Patent Agency Ranking
公开(公告)号：US20140177675A1
公开(公告)日：2014-06-26
申请号：US14137138
申请日：2013-12-20
Applicant: Kidde Technologies, Inc.
Inventor： Paul Rennie , Beth A. Dutson , Paul D. Smith , Robert G. Dunster
IPC: G01K5/48
CPC classification number: H01H61/0107 , G01K5/483
Abstract: A temperature sensing system comprises a conductive tube, a shape memory alloy (SMA) element, and a detector. The SMA element is disposed to create an electrical contact with the electrical tube when subjected to at least a critical temperature, and the detector is configured to identify an alarm condition when the conductive tube and the SMA element form a closed electrical circuit.
Abstract translation: 温度感测系统包括导电管，形状记忆合金（SMA）元件和检测器。 SMA元件设置成当经受至少临界温度时与电管产生电接触，并且检测器被配置为当导电管和SMA元件形成闭合电路时识别警报状况。
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公开(公告)号：US09429480B2
公开(公告)日：2016-08-30
申请号：US14152762
申请日：2014-01-10
Applicant: Kidde Technologies, Inc.
Inventor： Paul D. Smith , Paul Rennie , Beth A. Dutson
CPC classification number: G01K11/32 , G01K5/483 , G01K11/3206 , G01K2011/322 , G01K2011/324
Abstract: A temperature sensing system 10 comprises an optical waveguide 102, a shape memory alloy (SMA) element 106a, and an interrogator 12. The SMA element 106a is deformable as a function of temperature and at least partially surrounds the optical waveguide 102. The interrogator 12 is configured to detect distributed temperature along the optical waveguide 102 using spectroscopy and to detect strain in the optical waveguide 102 induced by deformation of the SMA element 106a to identify local hot spots along the optical waveguide 102.
Abstract translation: 温度感测系统10包括光波导102，形状记忆合金（SMA）元件106a和询问器12.SMA元件106a可根据温度变形，并至少部分地围绕光波导102.询问器12 被配置为使用光谱法检测沿着光波导102的分布温度，并且检测通过SMA元件106a的变形而引起的光波导102中的应变，以识别沿着光波导102的局部热点。
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公开(公告)号：US20180078804A1
公开(公告)日：2018-03-22
申请号：US15824566
申请日：2017-11-28
Applicant: Kidde Technologies, Inc.
Inventor： Paul D. Smith , Robert G. Dunster , Beth A. Dutson , Paul W. Weller
CPC classification number: A62C37/48 , A62C13/003 , A62C13/64 , A62C35/023 , A62C35/08 , A62C37/36 , H02N2/183
Abstract: A fire extinguishing apparatus includes a structure defining a first chamber containing an electrically operable explosive device. The apparatus also has a piezoelectric cell capable of producing an electrical output in response to the impact upon the piezoelectric cell. The apparatus also has a container of nonflammable pressurized fluid in contact with the structure, and a mechanical detection mechanism with a thermal sensor for producing a mechanical force at an established temperature. The mechanical force produced by the mechanical detection mechanism is applied to the piezoelectric cell to produce the electrical output that actuates the electrically operable explosive device.
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公开(公告)号：US09524841B2
公开(公告)日：2016-12-20
申请号：US14137138
申请日：2013-12-20
Applicant: Kidde Technologies, Inc.
Inventor： Paul Rennie , Beth A. Dutson , Paul D. Smith , Robert G. Dunster
CPC classification number: H01H61/0107 , G01K5/483
Abstract: A temperature sensing system comprises a conductive tube, a shape memory alloy (SMA) element, and a detector. The SMA element is disposed to create an electrical contact with the electrical tube when subjected to at least a critical temperature, and the detector is configured to identify an alarm condition when the conductive tube and the SMA element form a closed electrical circuit.
Abstract translation: 温度感测系统包括导电管，形状记忆合金（SMA）元件和检测器。 SMA元件设置成当经受至少临界温度时与电管产生电接触，并且检测器被配置为当导电管和SMA元件形成闭合电路时识别警报状况。
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公开(公告)号：US20150192476A1
公开(公告)日：2015-07-09
申请号：US14152762
申请日：2014-01-10
Applicant: Kidde Technologies, Inc.
Inventor： Paul D. Smith , Paul Rennie , Beth A. Dutson
IPC: G01K11/32
CPC classification number: G01K11/32 , G01K5/483 , G01K11/3206 , G01K2011/322 , G01K2011/324
Abstract: A temperature sensing system 10 comprises an optical waveguide 102, a shape memory alloy (SMA) element 106a, and an interrogator 12. The SMA element 106a is deformable as a function of temperature and at least partially surrounds the optical waveguide 102. The interrogator 12 is configured to detect distributed temperature along the optical waveguide 102 using spectroscopy and to detect strain in the optical waveguide 102 induced by deformation of the SMA element 106a to identify local hot spots along the optical waveguide 102.
Abstract translation: 温度感测系统10包括光波导102，形状记忆合金（SMA）元件106a和询问器12.SMA元件106a可根据温度变形，并至少部分地围绕光波导102.询问器12 被配置为使用光谱法检测沿着光波导102的分布温度，并且检测通过SMA元件106a的变形而引起的光波导102中的应变，以识别沿着光波导102的局部热点。
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