Abstract:
A display device comprises a touch panel including a plurality of electrode columns that each includes a plurality of electrodes positioned in the electrode column. The display device further comprises a plurality of lines, each of which is connected to a corresponding electrode included in a corresponding one of the plurality of electrode columns. The lengths of the lines within a first electrode column increase as the lines are positioned further from one end of the first electrode column that is not adjacent to the second electrode column in a direction substantially perpendicular to a longitudinal direction of the lines of the first electrode column and the lengths of the lines within a second electrode column decrease as the lines are positioned further from the one end of the first electrode column in the direction substantially perpendicular to a longitudinal direction of the lines of the second electrode column.
Abstract:
A display device includes a gate electrode on a substrate of a semiconductor device, a gate insulating film over the gate electrode, an active layer comprising an oxide including indium, zinc and gallium on the gate insulating film, and overlapping the gate electrode, and a source electrode and a drain electrode that are spaced apart from each other, wherein the active layer is formed from a zinc-rich target material, and an atomic % ratio of indium, zinc and gallium in the active layer is different from an atomic % ratio of the zinc-rich target material.
Abstract:
An oxide semiconductor crystallization method may include depositing an In—Ga—Zn oxide over the substrate while heating a substrate to a temperature of 200 to 300° C., and heat-treating the deposited In—Ga—Zn oxide at a temperature of 200 to 350° C., thereby forming an oxide semiconductor layer crystallized throughout an entire thickness thereof.
Abstract:
A color filter substrate for a display device includes a first protection layer on a plurality of touch sensing electrodes and touch driving electrode arrays; a bridge on the first protection layer and connecting the plurality of touch sensing electrodes; a second protection layer on the bridge; a black matrix on the second protection layer; a color filter layer on the black matrix, wherein the plurality of touch sensing electrodes include a first mesh pattern formed by crossing of first metal lines, the plurality of touch driving electrode arrays include a plurality of second mesh patterns formed by crossing of second metal lines, wherein the black matrix is formed at regions corresponding to the first and second metal lines, and wherein a line width of the black matrix is equal to or greater than each of the metal lines forming the first and second mesh patterns.
Abstract:
A method for manufacturing a semiconductor device is discussed. The method includes forming a gate electrode on a substrate, forming a gate insulating film over the substrate, depositing an In—Ga—Zn oxide over the gate insulating film while heating the substrate to a temperature of 200 to 300° C., an atomic percent ratio of Zn in the In—Ga—Zn oxide as-deposited being higher than that of In or Ga, heat-treating the deposited In—Ga—Zn oxide at a temperature of 200 to 350° C., thereby forming an active layer crystallized throughout an entire thickness of the active layer, and forming a source electrode and a drain electrode.