公开(公告)号：US20150346524A1

公开(公告)日：2015-12-03

申请号：US14817275

申请日：2015-08-04

Applicant: LensVector Inc.

Inventor： Bahram AFSHARI ,  Karen ASATRYAN ,  Peter P. CLARK ,  Tigran GALSTIAN ,  Michael J. NYSTROM ,  Vladimir PRESNIAKOV ,  Sergei YAKOVENKO ,  Armen ZOHRABYAN

IPC: G02F1/13 ,  G01R1/07

CPC classification number: G02F1/133351 ,  G01R1/071 ,  G02F1/1309 ,  G09G3/006 ,  Y10T29/49002 ,  Y10T29/49117 ,  Y10T29/49771

Abstract: Methods and apparatus for testing operation of a single or multiple tunable active optical device(s) operated by one or more driving electrodes are described. Test methods and apparatus are provided for device testing without necessarily requiring direct physical contact with the driving electrodes. Testing subjects devices to incident light along an optical path and to an external electric field applied to the device producing a dipolar charge distribution within the electrodes, causing the device to operate. The effect of device operation on incident light is optically sensed. The sensed effect is analyzed to identify device defects. Test methods and apparatus are provided for testing multiple unsingulated devices during fabrication employing a strip contact structure having contact strips connected to multiple devices and extending to wafer edges, such that singulating devices leaves portions of the strip contact structure exposed on device dice edges providing electrical contacts in use.

Abstract translation: 描述用于测试由一个或多个驱动电极操作的单个或多个可调谐有源光学器件的操作的方法和装置。 提供测试方法和装置用于器件测试，而不必要求与驱动电极直接物理接触。 测试设备沿着光学路径入射光并施加到施加到器件的外部电场，从而在电极内产生偶极电荷分布，使器件工作。 光学检测器件操作对入射光的影响。 分析检测到的效果以识别设备缺陷。 提供了测试方法和装置，用于在制造过程中测试多个不起毛的装置，使用具有连接到多个装置并且延伸到晶片边缘的接触条的带状接触结构，使得分离装置离开条形接触结构的部分，暴露在器件骰子边缘上， 正在使用。

公开(公告)号：US20170003539A1

公开(公告)日：2017-01-05

申请号：US15209101

申请日：2016-07-13

Applicant: LensVector Inc.

Inventor： Michael J. NYSTROM ,  Viktor Konovalov ,  Rubin Ma ,  Amir Tork ,  Aram Bagramyan ,  Vladimir Presniakov

IPC: G02F1/1343 ,  G02F1/1333

CPC classification number: G02F1/13439 ,  G02F1/133351 ,  G02F1/134309 ,  G02F1/1345 ,  G02F1/1347 ,  G02F2001/133302 ,  G02F2001/294 ,  G02F2201/42 ,  G02F2202/28

Abstract: A tunable liquid crystal optical device defining an optical aperture and having a layered structure. The device includes a film electrode formed on a surface of a first substrate and covered by a second substrate, and a contact structure filling a volume within the layered structure and contacting the film electrode. The contact structure is located outside of the optical aperture and provides an electrical connection surface much larger than a thickness of the film electrode, such that reliable electrical connections may be made to the electrode, particularly in the context of wafer scale manufacturing of such a device.

Abstract translation: 一种限定光学孔径并具有层状结构的可调谐液晶光学器件。 该器件包括形成在第一衬底的表面上并被第二衬底覆盖的膜电极，以及填充层状结构内的体积并使膜电极接触的接触结构。 接触结构位于光学孔的外侧，并且提供比膜电极的厚度大得多的电连接表面，使得可以对电极进行可靠的电连接，特别是在这种器件的晶片尺寸制造的上下文中 。

公开(公告)号：US20140076845A1

公开(公告)日：2014-03-20

申请号：US14026173

申请日：2013-09-13

Applicant: LensVector, Inc.

Inventor： Michael J. NYSTROM ,  Viktor KONOVALOV ,  Rubin MA ,  Amir TORK ,  Aram BAGRAMYAN ,  Vladimir PRESNIAKOV

IPC: G02F1/1343

CPC classification number: G02F1/13439 ,  G02F1/133351 ,  G02F1/134309 ,  G02F1/1345 ,  G02F1/1347 ,  G02F2001/133302 ,  G02F2001/294 ,  G02F2201/42 ,  G02F2202/28

Abstract: A tunable liquid crystal optical device defining an optical aperture and having a layered structure. The device includes a film electrode formed on a surface of a first substrate and covered by a second substrate, and a contact structure filling a volume within the layered structure and contacting the film electrode. The contact structure is located outside of the optical aperture and provides an electrical connection surface much larger than a thickness of the film electrode, such that reliable electrical connections may be made to the electrode, particularly in the context of wafer scale manufacturing of such a device.

Abstract translation: 一种限定光学孔径并具有层状结构的可调谐液晶光学器件。 该器件包括形成在第一衬底的表面上并被第二衬底覆盖的膜电极，以及填充层状结构内的体积并使膜电极接触的接触结构。 接触结构位于光学孔的外侧，并且提供比膜电极的厚度大得多的电连接表面，使得可以对电极进行可靠的电连接，特别是在这种器件的晶片尺寸制造的上下文中 。