公开(公告)号：US20240036753A1

公开(公告)日：2024-02-01

申请号：US17877240

申请日：2022-07-29

Applicant: MICRON TECHNOLOGY, INC.

Inventor： Wai Leong Chin ,  Francis Chee Khai Chew ,  Trismardawi Tanadi ,  Chun Sum Yeung ,  Lawrence Dumalag ,  Ekamdeep Singh

IPC: G06F3/06

CPC classification number: G06F3/064 ,  G06F3/0653 ,  G06F3/0604 ,  G06F3/0679

Abstract: A processing device in a memory sub-system determines whether a media endurance metric associated with a memory block of a memory device satisfies one or more conditions. In response to the one or more conditions being satisfied, a temperature of the memory block is compared to a threshold temperature range. In response to determining the temperature of the memory block is within the threshold temperature range, the processing device causes execution of a wordline leakage test of a wordline group of a set of wordline groups of the memory block. A result of the wordline leakage test of the target wordline group is determined and an action is executed based on the result of the wordline leakage test.

公开(公告)号：US20240338139A1

公开(公告)日：2024-10-10

申请号：US18748715

申请日：2024-06-20

Applicant: MICRON TECHNOLOGY, INC.

Inventor： Wai Leong Chin ,  Francis Chee Khai Chew ,  Trismardawi Tanadi ,  Chun Sum Yeung ,  Lawrence Dumalag ,  Ekamdeep Singh

IPC: G06F3/06 ,  G06F12/06

CPC classification number: G06F3/064 ,  G06F3/0604 ,  G06F3/0653 ,  G06F3/0679 ,  G06F12/0646 ,  G06F2212/7202 ,  G06F2212/7204 ,  G06F2212/7206

Abstract: A memory sub-system causing execution of a first wordline leakage test of a first wordline group of a set of wordline groups of a memory block in response to determining a temperature of the memory block is within a threshold temperature range. A first result of the first wordline leakage test is determined. A second wordline leakage test of a second wordline group is caused to be executed and a second result is determined. A determination is made that the first result of the first wordline leakage test of the first wordline group satisfies a first condition. A determination is made that the second result of the second wordline leakage test of the second wordline group satisfies a second condition. In response to satisfaction of the conditions, an action is executed.

公开(公告)号：US12045482B2

公开(公告)日：2024-07-23

申请号：US17877240

申请日：2022-07-29

Applicant: MICRON TECHNOLOGY, INC.

Inventor： Wai Leong Chin ,  Francis Chee Khai Chew ,  Trismardawi Tanadi ,  Chun Sum Yeung ,  Lawrence Dumalag ,  Ekamdeep Singh

IPC: G06F3/06 ,  G06F12/06

CPC classification number: G06F3/064 ,  G06F3/0604 ,  G06F3/0653 ,  G06F3/0679 ,  G06F12/0646 ,  G06F2212/7202 ,  G06F2212/7204 ,  G06F2212/7206

Abstract: A processing device in a memory sub-system determines whether a media endurance metric associated with a memory block of a memory device satisfies one or more conditions. In response to the one or more conditions being satisfied, a temperature of the memory block is compared to a threshold temperature range. In response to determining the temperature of the memory block is within the threshold temperature range, the processing device causes execution of a wordline leakage test of a wordline group of a set of wordline groups of the memory block. A result of the wordline leakage test of the target wordline group is determined and an action is executed based on the result of the wordline leakage test.