公开(公告)号：US20240017990A1

公开(公告)日：2024-01-18

申请号：US18301162

申请日：2023-04-14

Applicant: Microfabrica Inc.

Inventor： Duy P. Le ,  Rulon J. Larsen ,  Jeffrey A. Thompson ,  Uri Frodis ,  Dale S. McPherson ,  Kleun Kim ,  Mahmood Samiee ,  Nina C. Levy ,  Dennis R. Smalley

IPC: B81C99/00

CPC classification number: B81C99/003 ,  B81C99/004 ,  B81C2201/0105 ,  B81C2201/013

Abstract: Electronic test probes formed in a batch have a plurality of multi-material layers wherein at least one of the materials is a sacrificial material and at least one other material is a structural material. Successfully formed or good test probes are separated from unsuccessfully formed or bad test probes