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公开(公告)号:US20240296090A1
公开(公告)日:2024-09-05
申请号:US18415627
申请日:2024-01-17
Applicant: Micron Technology, Inc.
Inventor: Joseph M. MCCRATE , Kirthi SHENOY , Marco SFORZIN , Brian M. TWAIT
IPC: G06F11/10
CPC classification number: G06F11/1044
Abstract: Provided is a memory system comprising a plurality of memory components. The ECC decoding is configured to construct first and second codewords from a single set of data within the plurality of memory components and perform error correction code (ECC) decoding on the first and second codewords received read from the plurality of memory components wherein the ECC decoding is configured to (i) detect random errors in the first received codeword and (ii) use data associated with the detected random errors to correct erasures in the second received codeword.
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公开(公告)号:US20240378113A1
公开(公告)日:2024-11-14
申请号:US18415628
申请日:2024-01-17
Applicant: Micron Technology, Inc.
Inventor: Joseph M. MCCRATE , Kirthi SHENOY , Marco SFORZIN , Brian M. TWAIT
IPC: G06F11/10
Abstract: Provided is a memory system comprising a plurality of memory components. The ECC decoding is configured to construct first and second codewords from a single set of data within the plurality of memory components and perform error correction code (ECC) decoding on the first and second codewords received read from the plurality of memory components wherein the ECC decoding is configured to (i) detect random errors in the first received codeword and (ii) use data associated with the detected random errors to correct erasures in the second received codeword.
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公开(公告)号:US20240378114A1
公开(公告)日:2024-11-14
申请号:US18415631
申请日:2024-01-17
Applicant: Micron Technology, Inc.
Inventor: Joseph M. MCCRATE , Kirthi SHENOY , Marco SFORZIN , Brian M. TWAIT
IPC: G06F11/10
Abstract: Provided is a memory system comprising a plurality of memory components. The ECC decoding is configured to construct first and second codewords from a single set of data within the plurality of memory components and perform error correction code (ECC) decoding on the first and second codewords received read from the plurality of memory components wherein the ECC decoding is configured to (i) detect random errors in the first received codeword and (ii) use data associated with the detected random errors to correct erasures in the second received codeword.
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公开(公告)号:US20240297668A1
公开(公告)日:2024-09-05
申请号:US18415626
申请日:2024-01-17
Applicant: Micron Technology, Inc.
Inventor: Joseph M. MCCRATE , Kirthi SHENOY , Marco SFORZIN , Brian M. TWAIT
CPC classification number: H03M13/373 , G06F11/1044 , H03M13/1575
Abstract: Provided is a memory system comprising a plurality of memory components. The ECC decoding is configured to construct first and second codewords from a single set of data within the plurality of memory components and perform error correction code (ECC) decoding on the first and second codewords received read from the plurality of memory components wherein the ECC decoding is configured to (i) detect random errors in the first received codeword and (ii) use data associated with the detected random errors to correct erasures in the second received codeword.
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公开(公告)号:US20240345920A1
公开(公告)日:2024-10-17
申请号:US18415634
申请日:2024-01-17
Applicant: Micron Technology, Inc.
Inventor: Joseph M. MCCRATE , Kirthi SHENOY , Marco SFORZIN , Brian M. TWAIT
IPC: G06F11/10
CPC classification number: G06F11/1068 , G06F11/1004
Abstract: Provided is an apparatus comprising a search engine configured to (i) receive parallel input of a set of syndrome polynomial products corresponding to a set of ECC words and (ii) produce corresponding sets of polynomial roots therefrom and a sequence detector configured to identify sequences within each of the polynomial roots within the set of roots. Also provided is sequence check logic for (i) combining the identified sequences within each of the polynomial roots and (ii) performing a sequence check of the combined identified sequences to determine whether only one of the identified sequences if valid; and an error location generator to derive an error location in each of the ECC words within the set responsive to the valid sequence.
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公开(公告)号:US20240272981A1
公开(公告)日:2024-08-15
申请号:US18415632
申请日:2024-01-17
Applicant: Micron Technology, Inc.
Inventor: Joseph M. MCCRATE , Kirthi SHENOY , Marco SFORZIN , Brian M. TWAIT
IPC: G06F11/10
CPC classification number: G06F11/1016 , G06F11/1068
Abstract: Provided is an apparatus comprising a search engine configured to (i) receive parallel input of a set of syndrome polynomial products corresponding to a set of ECC words and (ii) produce corresponding sets of polynomial roots therefrom and a sequence detector configured to identify sequences within each of the polynomial roots within the set of roots. Also provided is sequence check logic for (i) combining the identified sequences within each of the polynomial roots and (ii) performing a sequence check of the combined identified sequences to determine whether only one of the identified sequences if valid; and an error location generator to derive an error location in each of the ECC words within the set responsive to the valid sequence.
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