SYSTEM FOR CONTROLLING LEAKAGE CURRENT IN INTEGRATED CIRCUITS

    公开(公告)号:US20230361772A1

    公开(公告)日:2023-11-09

    申请号:US17662086

    申请日:2022-05-05

    Applicant: NXP B.V.

    CPC classification number: H03K17/6871

    Abstract: An integrated circuit (IC) includes one or more active transistors and multiple series-coupled dummy transistors. The dummy transistors are coupled between two active transistors and/or at the ends of each active transistor. When the dummy transistors are coupled between two active transistors, apart from two conductive regions that are coupled to two active transistors, each remaining conductive region of the dummy transistors is maintained in a floating state to control a leakage current between the two active transistors. Similarly, when the dummy transistors are coupled at an end of one active transistor, apart from one conductive region that is coupled to the active transistor, each remaining conductive region of the dummy transistors is maintained in the floating state to control a leakage current between the active transistor and the dummy transistors.

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