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Patent Agency Ranking
公开(公告)号：US20180073923A1
公开(公告)日：2018-03-15
申请号：US15677606
申请日：2017-08-15
Applicant: Otsuka Electronics Co., Ltd.
Inventor： Nobuyuki INOUE , Taku NAGASHIMA
IPC: G01J3/02 , G01N21/359
CPC classification number: G01J3/027 , G01J3/0218 , G01J3/0221 , G01J3/0264 , G01J3/28 , G01J3/2803 , G01J2003/2876 , G01N21/274 , G01N21/359
Abstract: There is provided an optical measurement method using a detector having a detection sensitivity to at least a near-infrared region. The optical measurement method including: obtaining an output value by measuring a light sample at any exposure time with the detector; and correcting the output value with an amount of correction corresponding to the output value, when the exposure time at which the output value is obtained is within a second range. The amount of correction includes a product of a coefficient and a square of the exposure time, the coefficient indicating a degree to which an output value obtained when the light sample is measured with the detector at an exposure time within the second range deviates from output linearity obtained when the light sample is measured with the detector at an exposure time within a first range.
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公开(公告)号：US20190353523A1
公开(公告)日：2019-11-21
申请号：US16414798
申请日：2019-05-17
Applicant: Otsuka Electronics Co., Ltd.
Inventor： Toshiki SHINKE , Shiro KAWAGUCHI , Nobuyuki INOUE
Abstract: an optical measurement apparatus includes: a probe including a transmissive optical member having a reference surface, the probe being configured to irradiate a sample with light through the reference surface, and receive a first reflected light from the reference surface, a second reflected light from a front side of the sample, and a third reflected light from a back side of the sample; and a calculator configured to calculate a first distance from the reference surface to the front side of the sample with use of a first reflection interference light to be generated by the first reflected light and the second reflected light, and to calculate a thickness of the sample with use of a second reflection interference light to be generated by the second reflected light and the third reflected light.
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公开(公告)号：US20180347964A1
公开(公告)日：2018-12-06
申请号：US15996941
申请日：2018-06-04
Applicant: Otsuka Electronics Co., Ltd.
Inventor： Nobuyuki INOUE , Kunikazu TAGUCHI
CPC classification number: G01B11/06 , G01B9/02024 , G01B9/02041 , G01B9/02043
Abstract: An optical measurement apparatus includes an irradiation optical system which linearly irradiates a measurement target with measurement light having a certain wavelength range, a measurement optical system which receives linear measurement interference light which is transmitted light or reflected light originating from the measurement target as a result of irradiation with the measurement light, and a processing device. The processing device includes a first calculation module that calculates a modification factor depending on with an angle of incidence on the measurement optical system from each measurement point in association with a region in the two-dimensional image corresponding to each measurement point in the measurement target irradiated with the measurement light and a second calculation module that calculates optical characteristics of the measurement target by applying the corresponding modification factor to a value for each pixel included in the two-dimensional image.
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公开(公告)号：US20190139249A1
公开(公告)日：2019-05-09
申请号：US16172462
申请日：2018-10-26
Applicant: Otsuka Electronics Co., Ltd.
Inventor： Yoshihiko NISHIDA , Yoshi ENAMI , Nobuyuki INOUE
Abstract: An optical characteristics measuring method for measuring optical characteristics of a subject, the optical characteristics measuring method including: a step of acquiring one or more captured images including the subject, using an image capturing apparatus that is located at a predetermined distance from the subject, and is configured to be displaceable relative to the subject, while maintaining the predetermined distance; and a step of creating, based on the one or more captured images thus acquired, a virtual image including the subject and acquired from one or more analysis points each located at a position other than a position on a plane that includes the trajectory of the image capturing apparatus.
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公开(公告)号：US20180347965A1
公开(公告)日：2018-12-06
申请号：US15996970
申请日：2018-06-04
Applicant: Otsuka Electronics Co., Ltd.
Inventor： Nobuyuki INOUE , Kunikazu TAGUCHI
CPC classification number: G01B11/06 , G01B9/02024 , G01B9/02041 , G01B9/02043
Abstract: An optical measurement method with an optical measurement apparatus including an irradiation optical system and a measurement optical system is provided. The optical measurement method includes obtaining a distribution of actually measured values when angles of incidence are different for the same sample, calculating a modification factor depending on an angle of incidence on the measurement optical system from each measurement point in association with a region in the two-dimensional image corresponding to each measurement point in the measurement target irradiated with the measurement light, and calculating optical characteristics including a refractive index of the sample based on a group of pixel values in one row or a plurality of rows along any one direction in the distribution of the actually measured values and a corresponding modification factor.
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