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1.
公开(公告)号:US12055491B2
公开(公告)日:2024-08-06
申请号:US17772305
申请日:2020-10-12
Inventor: Won-Shik Choi , Seok-Chan Yoon , Ho-Jun Lee
CPC classification number: G01N21/6456 , G01B9/02041 , H04N3/08 , H04N23/55 , H04N23/56 , H04N23/667
Abstract: A focus scan type imaging device for imaging a target object in a sample that induces aberration proposed. The device includes: a light source unit for emitting a beam; an optical interferometer for splitting the beam emitted from the light source into a sample wave and a reference wave, and providing an interference wave formed by interference between a reflection wave that is the sample wave reflected from the sample and the reference wave; a camera module for imaging the interference wave; a scanning mirror disposed on an optical path of the sample wave of the optical interferometer and configured to reflect the sample wave to cause the sample wave to scan the sample; a wavefront shaping modulator disposed on the optical path of the sample wave of the optical interferometer; and an imaging controller configured to operate in a phase map calculation mode and in an imaging mode.
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2.
公开(公告)号:US20240230313A9
公开(公告)日:2024-07-11
申请号:US17973147
申请日:2022-10-25
Applicant: Val Parker
Inventor: Val Parker
CPC classification number: G01B9/02041 , G01B9/02034 , G01P3/36
Abstract: The Solid-State distinct-unidirectional photonic interferometer is an onboard opto-electronic navigational instrument that utilizes propagation of light within the instrument for continuously and independently, from other sources, detecting and measuring position, orientation, displacement, and rates of the displacement of an object in motion from within and from the motion itself.
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公开(公告)号:US20240201084A1
公开(公告)日:2024-06-20
申请号:US18544361
申请日:2023-12-18
Applicant: Trustees of Boston University
Inventor: M. Selim Ünlü , Iris Celebi , Mete Aslan
IPC: G01N21/45 , G01B9/02 , G01B9/02001 , G01N21/21 , G01N21/55
CPC classification number: G01N21/45 , G01B9/02011 , G01B9/02041 , G01N21/21 , G01N21/55 , G01N2201/06153
Abstract: Aspects of inventive concepts described herein relate to an interferometric reflectance imaging system. The system can include an imaging sensor including pixels that are preferentially sensitive to a plurality of light components; an illumination source configured to emit illumination light along an illumination path, the illumination light including the plurality of light components; and a target including a target substrate configured to support one or more nanoparticles on a surface of the target substrate. The system may be configured to, at a nominal focus position: generate an image at the imaging sensor based, at least in part, on the light reflected from the target interfering with light scattered from nanoparticles on the target substrate; and process the image to detect the nanoparticles on the target substrate.
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公开(公告)号:US11867507B1
公开(公告)日:2024-01-09
申请号:US18143843
申请日:2023-05-05
Applicant: MLOptic Corp
Inventor: Pengfei Wu , Wei Zhou
IPC: G01B9/02098 , G01B9/02
CPC classification number: G01B9/02098 , G01B9/02041
Abstract: A system for providing a virtual distance of a device under test, the system including a light source, a wedge shear plate including a first surface, a second surface and a wedge angle, wherein the second surface is disposed at the wedge angle with respect to the first surface and the wedge shear plate is configured to be disposed between the device under test and the light source, a first detector configured for receiving a first interference pattern formed as a result of the light source being disposed through and reflected by the first surface and the second surface of the wedge shear plate and a second detector configured for receiving a second interference pattern formed as a result of the light source being disposed through and reflected by the first surface and the second surface of the wedge shear plate.
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公开(公告)号:US11796925B2
公开(公告)日:2023-10-24
申请号:US17709104
申请日:2022-03-30
Applicant: KLA Corporation
Inventor: Yuval Lubashevsky , Itay Gdor , Daria Negri , Eitan Hajaj
CPC classification number: G03F7/70633 , G01B9/02041
Abstract: An overlay metrology system may include an illumination source and illumination optics to illuminate an overlay target on a sample with illumination from the illumination source as the sample is in motion with respect to the illumination from the illumination source in accordance with a measurement recipe. The overlay target may include one or more cells, where a single cell is suitable for measurement along a particular direction. Such a cell may include two or more gratings with different pitches. Further, the system may include two or more photodetectors, each configured to capture three diffraction lobes from the two or more grating structures. The system may further include a controller to determine an overlay measurement associated with each cell of the overlay target.
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公开(公告)号:US11659991B2
公开(公告)日:2023-05-30
申请号:US16606040
申请日:2018-04-18
Applicant: ROWIAK GMBH
Inventor: Holger Lubatschowski
IPC: G01B9/02 , A61B3/10 , G01B9/02091
CPC classification number: A61B3/102 , G01B9/02041 , G01B9/02091
Abstract: An OCT examination device for recording an object comprises an OCT radiation source which emits OCT radiation, an OCT beam path, a housing, an exit opening formed in the housing for the OCT radiation of the OCT radiation source, an OCT exit direction of the radiation through the exit opening, a control unit connected to the OCT radiation source OCT radiation and configured to record a multiplicity of measurement profiles mutually separated in a recording period and, within the recording period, to drive the OCT radiation source in order to emit the OCT radiation and the OCT radiation receiver in order to receive the backscattered OCT radiation, and to keep an OCT output direction and an OCT exit direction constant with respect to one another in their angular orientation during the recording period.
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公开(公告)号:US20190145755A1
公开(公告)日:2019-05-16
申请号:US16156030
申请日:2018-10-10
Applicant: ROLLS-ROYCE plc
Inventor: Murukeshan VADAKKE MATHAM , Kelvin H K CHAN , Guru Prasad ARUDI SUBBARAO , Prabhathan PATINHAREKANDY , Aswin HARIDAS , Pulkit KAPUR
CPC classification number: G01B9/02096 , G01B9/02041 , G01B9/02094 , G01B11/30 , G01B11/303
Abstract: An imaging probe (102) for use in measuring surface roughness by angular speckle correlation is shown. The imaging probe comprises a first illumination fibre (201) to illuminate a sample location (103) on a surface, and having an input end for coupling of coherent light into the fibre, and an output end cleaved at an angle θ1, a second illumination fibre (202) to illuminate the sample location on the surface, and having an input end for coupling of coherent light into the fibre, and an output end cleaved at an angle θ2 that is different from θ1, and an image transmission system (204) for transmission of a to speckle pattern caused by illumination of the sample location on the surface by coherent light from either the first illumination fibre or the second illumination fibre.
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公开(公告)号:US20180184894A1
公开(公告)日:2018-07-05
申请号:US15847843
申请日:2017-12-19
Applicant: VISUNEX MEDICAL SYSTEMS CO. LTD.
Inventor: Wei Su
CPC classification number: A61B3/102 , A61B3/0091 , A61B3/15 , A61B5/0066 , A61B2562/0233 , G01B9/02015 , G01B9/02041 , G01B9/02091 , G06T2207/30041
Abstract: Various embodiments of the present disclosure describe an ultra-wide field of view (FOV) optical coherence tomography (OCT) imaging system. The ultra-wide FOV OCT imaging system can include an imaging probe, a console and a cable. The imaging probe can include an optical widow, a first imaging module and a second imaging module. The first imaging module is configured to form a first image of the eye. The second imaging module is configured to form a second image of the eye. The second imaging module can include a scanning mirror configured to receive a sample arm portion of a second light beam from a second light source and scan the sample arm portion. The console can include the second light source, an interferometer, and a processor. The cable is coupled between the console and the imaging probe and includes a first fiber, a second fiber and a third fiber.
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9.
公开(公告)号:US10012491B2
公开(公告)日:2018-07-03
申请号:US15310025
申请日:2014-10-27
Applicant: CHANGCHUN INSTITUTE OF OPTICS, FINE MECHANICS AND PHYSICS, CHINESE ACADEMY OF SCIENCES , VTT-NTM OÜ
Inventor: Nikolay Voznesenskiy , Dongmei Ma , Chunshui Jin , Haitao Zhang , Jie Yu , Mariia Voznesenskaia , Tatiana Voznesenskaia , Wenlong Zhang
CPC classification number: G01B9/02038 , G01B9/02041 , G01B9/02072 , G01B11/2441 , G01M11/005 , G01M11/0271
Abstract: A diffraction interferometer includes a reference light passage, a test light passage and a pinhole substrate. The pinhole substrate includes a test pinhole and a reference pinhole. The diffracted wavefront emitted from the test pinhole is reflected by the optical component to be tested adjacent to the pinhole substrate and a converge adjacent to the reference pinhole. The diffracted wavefront includes surface shape information of an optical component to be tested that is reflected by the pinhole substrate. Interference with the diffracted wavefront is emitted by the reference pinhole and forms interference fringes. The large numerical aperture phase-shifting dual pinhole diffraction interferometer adopts a dual pinhole substrate and a illumination manner with two converged light paths to enable the separation of the reference light and test light, to prevent disturbance between the two light paths, which would induce the change of interferogram status during phase-shifting.
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公开(公告)号:US09952417B2
公开(公告)日:2018-04-24
申请号:US15627866
申请日:2017-06-20
Applicant: Alentic Microscience Inc.
Inventor: Alan Marc Fine
IPC: G02B21/00 , G02B21/36 , G01N15/10 , G01N15/14 , G06K9/00 , G01N33/80 , G01T1/02 , G01B9/02 , G06T7/00 , G03H1/04 , G01N11/00 , G03H1/00 , G01N15/00 , C12M1/34
CPC classification number: G02B21/0008 , C12M41/36 , G01B9/02041 , G01N15/1429 , G01N15/1434 , G01N15/1463 , G01N15/1475 , G01N33/80 , G01N2011/008 , G01N2015/0069 , G01N2015/1006 , G01N2015/1486 , G01N2015/149 , G01T1/02 , G02B21/00 , G02B21/0004 , G02B21/361 , G02B21/365 , G03H2001/005 , G03H2001/045 , G06K9/00127 , G06K9/00147 , G06T7/0012 , G06T2207/10056 , G06T2207/30242 , Y10S435/808
Abstract: Among other things, a method comprises imaging a sample displaced between a sensor surface and a surface of a microscopy sample chamber to produce an image of at least a part of the sample. The image is produced using lensless optical microscopy, and the sample contains at least blood from a subject. The method also comprises automatically differentiating cells of different types in the image, generating a count of one or more cell types based on the automatic differentiation, and deriving a radiation dose the subject has absorbed based on the count.
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