公开(公告)号：US20220055147A1

公开(公告)日：2022-02-24

申请号：US17378815

申请日：2021-07-19

Applicant: Panasonic Intellectual Property Management Co., Ltd.

Inventor： JUN YOKOYAMA ,  TAKASHI URASHIMA ,  YOHEI TAKECHI

IPC: B23K26/03 ,  G01B11/00 ,  B23K26/082 ,  G02B19/00 ,  G02B26/08 ,  G02B26/10

Abstract: A laser processing apparatus includes a laser oscillator that oscillates processing laser light to be incident on a processing point on a processing surface of a workpiece, a coupling mirror that deflects or transmits the processing laser light and measurement light to be incident on the processing point toward the processing point, a measurement light deflection unit that changes an incident angle of the measurement light on the coupling mirror, a lens that concentrates the processing laser light and the measurement light on the processing point, a controller that controls the laser oscillator and the measurement light deflection unit, a measurement processor that measures a depth of a keyhole generated at the processing point by the processing laser light by using an optical interference signal based on an interference generated by an optical path difference between the measurement light reflected at the processing point and reference light, and a beam position measurement unit that measures positions of the processing laser light and the measurement light.

公开(公告)号：US20220373779A1

公开(公告)日：2022-11-24

申请号：US17723530

申请日：2022-04-19

Applicant: Panasonic Intellectual Property Management Co., Ltd.

Inventor： TAKASHI URASHIMA ,  DAICHI HIGASHI

IPC: G02B21/14 ,  G02B21/02 ,  F21V8/00 ,  G02B19/00

Abstract: A phase-contrast microscope includes a light source section configured to emit light; a light guide including a plurality of optical fibers, the light guide transmitting the light emitted from the light source section through the plurality of optical fibers; and an object lens including a lens and an annular phase film, the annular phase film being on the side to which light passes through the lens, the object lens being configured to enlarge an image on a sample irradiated with the light transmitted by the light guide. The plurality of optical fibers include a plurality of emission faces arranged to form a ring, and the light guide is disposed in such a manner that the plurality of emission faces are in a conjugate position to the annular phase film.

公开(公告)号：US20200376591A1

公开(公告)日：2020-12-03

申请号：US16984261

申请日：2020-08-04

Applicant: Panasonic Intellectual Property Management Co., Ltd.

Inventor： TORU SAKAI ,  MICHIO SAKURAI ,  TAKASHI URASHIMA ,  DAICHI HIGASHI

IPC: B23K26/03 ,  B23K26/21 ,  B23K31/12 ,  B23K26/06 ,  B23K26/082 ,  G01B11/22

Abstract: A laser welding device (10) for welding a weld part (35) with laser light (L) includes: a laser emitting head (20) overlapping the laser light (L) and a measurement light (S) coaxially with each other and applying the laser light (L) and the measurement light (S) to the weld part (35), the measurement light (S) having a wavelength different from a wavelength of the laser light (L); a first parallel plane plate and a second parallel plane plate, changing an irradiation position of the measurement light (S) such that the irradiation position orbitally move around a center of rotation that moves on a predetermined welding path in a radius of rotation that is smaller than 1/2 of a spot diameter of the laser light (L); a measuring instrument (14) repeatedly measuring a weld penetration depth of the weld part (35) based on the measurement light (S) that is emitted from the laser emitting head (20) and is reflected on the weld part (35) while the measurement light (S) is being orbitally moved; and a determiner (17) determining the weld penetration depth of the weld part (35) using a plurality of measured values of the weld penetration depth, the plurality of measured values being measured by the measuring instrument (14) within a fixed time period while shifting a start time point of the fixed time period.

公开(公告)号：US20250035508A1

公开(公告)日：2025-01-30

申请号：US18917559

申请日：2024-10-16

Applicant: Panasonic Intellectual Property Management Co., Ltd.

Inventor： JUN YOKOYAMA ,  TATSUYA YONEMURA ,  TAKASHI URASHIMA ,  YOHEI TAKECHI ,  HIDEYUKI TACHIKA

IPC: G01M11/02

Abstract: At least three light fluxes of the test pattern projected from optical module 1 are acquired by wavefront sensor 9, the parallelism of the respective light fluxes is calculated, and the orientation of display panel 5 of the optical module is adjusted so that the parallelism of each light flux coincides.

公开(公告)号：US20250035427A1

公开(公告)日：2025-01-30

申请号：US18916775

申请日：2024-10-16

Applicant: Panasonic Intellectual Property Management Co., Ltd.

Inventor： YASUHIRO KABETANI ,  TAKASHI URASHIMA

IPC: G01B9/02091

Abstract: When light adjusted at equal frequency intervals by optical comb generation filter 205 is incident and emitted from measurement head 207 to measurement target W, the light adjusted at equal frequency intervals by optical comb generation filter 205 is divided into measurement light and reference light by light division unit 208, and interference light in which reflected light of the measurement light from measurement target W and the reference light are multiplexed is detected by interference light detection unit 210.