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    Technique for determining performance characteristics of electronic devices and systems
    2.
    发明授权
    Technique for determining performance characteristics of electronic devices and systems 有权
    确定电子设备和系统性能特点的技术

    公开(公告)号：US09562934B2

    公开(公告)日：2017-02-07

    申请号：US13920368

    申请日：2013-06-18

    Applicant: Rambus Inc.

    Inventor： Haw-Jyh Liaw ,  Xingchao Yuan ,  Mark A. Horowitz

    IPC: G01R23/20 ,  G01R31/317 ,  G11C29/02 ,  G11C29/50 ,  G11C29/56 ,  H04B17/309

    CPC classification number: G01R31/31708 ,  G01R23/16 ,  G01R23/20 ,  G01R31/31717 ,  G11C29/02 ,  G11C29/022 ,  G11C29/025 ,  G11C29/50012 ,  G11C29/56 ,  G11C29/56012 ,  G11C2029/5004 ,  H04B17/309

    Abstract: A technique for determining performance characteristics of electronic devices and systems is disclosed. In one embodiment, the technique is realized by measuring a first response on a first transmission line from a single pulse transmitted on the first transmission line, and then measuring a second response on the first transmission line from a single pulse transmitted on at least one second transmission line, wherein the at least one second transmission line is substantially adjacent to the first transmission line. The worst case bit sequences for transmission on the first transmission line and the at least one second transmission line are then determined based upon the first response and the second response for determining performance characteristics associated with the first transmission line.

    Abstract translation: 公开了一种用于确定电子设备和系统的性能特征的技术。 在一个实施例中，该技术通过从在第一传输线上传输的单个脉冲测量第一传输线上的第一响应，然后在从至少一秒钟传输的单个脉冲测量第一传输线上的第二响应来实现 传输线，其中所述至少一个第二传输线基本上与所述第一传输线相邻。 然后基于用于确定与第一传输线相关联的性能特性的第一响应和第二响应来确定用于在第一传输线和至少一个第二传输线上传输的最差情况比特序列。

    Technique for determining performance characteristics of electronic devices and systems
    3.
    发明授权
    Technique for determining performance characteristics of electronic devices and systems 有权

    公开(公告)号：US10782344B2

    公开(公告)日：2020-09-22

    申请号：US15957864

    申请日：2018-04-19

    Applicant: Rambus Inc.

    Inventor： Haw-Jyh Liaw ,  Xingchao Yuan ,  Mark A. Horowitz

    IPC: G01R31/317 ,  G01R23/16 ,  G01R23/20 ,  H04B17/309 ,  G11C29/02 ,  G11C29/56 ,  G11C29/50

    Abstract: A technique for determining performance characteristics of electronic devices and systems is disclosed. In one embodiment, the technique is realized by measuring a first response on a first transmission line from a single pulse transmitted on the first transmission line, and then measuring a second response on the first transmission line from a single pulse transmitted on at least one second transmission line, wherein the at least one second transmission line is substantially adjacent to the first transmission line. The worst case bit sequences for transmission on the first transmission line and the at least one second transmission line are then determined based upon the first response and the second response for determining performance characteristics associated with the first transmission line.

    Technique for Determining Performance Characteristics Of Electronic Devices And Systems
    5.
    发明申请
    Technique for Determining Performance Characteristics Of Electronic Devices And Systems 有权
    确定电子设备和系统性能特点的技术

    公开(公告)号：US20140070819A1

    公开(公告)日：2014-03-13

    申请号：US13920368

    申请日：2013-06-18

    Applicant: Rambus Inc.

    Inventor： Haw-Jyh Liaw ,  Xingchao Yuan ,  Mark A. Horowitz

    IPC: G01R23/20

    CPC classification number: G01R31/31708 ,  G01R23/16 ,  G01R23/20 ,  G01R31/31717 ,  G11C29/02 ,  G11C29/022 ,  G11C29/025 ,  G11C29/50012 ,  G11C29/56 ,  G11C29/56012 ,  G11C2029/5004 ,  H04B17/309

    Abstract: A technique for determining performance characteristics of electronic devices and systems is disclosed. In one embodiment, the technique is realized by measuring a first response on a first transmission line from a single pulse transmitted on the first transmission line, and then measuring a second response on the first transmission line from a single pulse transmitted on at least one second transmission line, wherein the at least one second transmission line is substantially adjacent to the first transmission line. The worst case bit sequences for transmission on the first transmission line and the at least one second transmission line are then determined based upon the first response and the second response for determining performance characteristics associated with the first transmission line.

    Abstract translation: 公开了一种用于确定电子设备和系统的性能特征的技术。 在一个实施例中，该技术通过从在第一传输线上传输的单个脉冲测量第一传输线上的第一响应，然后在从至少一秒钟传输的单个脉冲测量第一传输线上的第二响应来实现 传输线，其中所述至少一个第二传输线基本上与所述第一传输线相邻。 然后基于用于确定与第一传输线相关联的性能特性的第一响应和第二响应来确定用于在第一传输线和至少一个第二传输线上传输的最差情况比特序列。

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