Method and apparatus to electrically qualify high speed PCB connectors
    1.
    发明授权
    Method and apparatus to electrically qualify high speed PCB connectors 有权
    电连接高速PCB连接器的方法和装置

    公开(公告)号:US07525319B1

    公开(公告)日:2009-04-28

    申请号:US12200208

    申请日:2008-08-28

    IPC分类号: G01R31/04 G01R31/02 G01R31/28

    CPC分类号: G01R31/046

    摘要: A method of electrically qualifying high speed printed circuit board (PCB) connectors includes mounting a PCB connector on a test card, sending bit patterns through a first portion of the test card, evaluating a waveform on a sense signal on a second portion of the test card for the bit patterns launched on said first portion of the test card to measure common mode noise, and comparing the measured common mode noise of the second portion of the test card to a golden standard performed on a pre-qualified connector. The first portion of the test card comprises connectors to inject bit patterns. The second portion of the test card includes a split plane which induces common mode noise on a sense signal, the sense signal, and a termination pack. If the measured common mode noise on the PCB connector is worse than the golden standard, then the PCB connector is disqualified. If the measured common mode noise on the PCB connector is as good as or better than the golden standard, then the PCB connector is qualified. A first section of the PCB connector connects to the first portion of the test card and a second section of the PCB connector connects to the second portion of the test card. Transmission lines in the test card and the sense line are tightly coupled by shortening a distance between the sense line and the transmission lines.

    摘要翻译: 电气限定高速印刷电路板(PCB)连接器的方法包括将PCB连接器安装在测试卡上,通过测试卡的第一部分发送位模式,在测试的第二部分上评估感测信号上的波形 在测试卡的所述第一部分上发射的位模式的卡用于测量共模噪声,以及将测试卡的第二部分的测量的共模噪声与在预先标定的连接器上执行的黄金标准进行比较。 测试卡的第一部分包括用于注入位模式的连接器。 测试卡的第二部分包括在感测信号,感测信号和终端包上引起共模噪声的分离平面。 如果PCB连接器上测得的共模噪声比黄金标准差,则PCB连接器不合格。 如果PCB连接器上测得的共模噪声与黄金标准一样好或更好,则PCB连接器是合格的。 PCB连接器的第一部分连接到测试卡的第一部分,并且PCB连接器的第二部分连接到测试卡的第二部分。 通过缩短感测线和传输线之间的距离,测试卡和感测线中的传输线紧密耦合。