Patent search ap:("SAMSUNG ELECTRONICS CO. Page LTD.") AND inv:"Hwang-Jin Yeo"

1.

发明授权
Probe including an alignment key protruded from a side of an alignment beam and a probe card including the same 有权

公开(公告)号：US11061052B2

公开(公告)日：2021-07-13

申请号：US16368493

申请日：2019-03-28

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Sung-Hoon Lee , Byoung-Joo Kim , Mi-Rye Lee , Hwang-Jin Yeo , Tae-Jong Lee

IPC: G01R1/067 , G01R31/26 , G01R1/073

Abstract: A probe includes a probe body for providing an object with a test signal; a tip arranged on an end of the probe body to make contact with the object; and an alignment key protruded from a side of the probe body.

Patent Agency Ranking