公开(公告)号：US20130313999A1

公开(公告)日：2013-11-28

申请号：US13799795

申请日：2013-03-13

Applicant: SAMSUNG Electronics Co., Ltd.

Inventor： Yong-Hun KIM ,  Hyungtae KIM

IPC: H05B37/02

CPC classification number: H05B37/02 ,  G09G3/3648 ,  G09G3/3696 ,  G09G2320/0276 ,  G09G2320/0673

Abstract: A gamma voltage generating circuit includes a gamma voltage distribution unit configured to divide a reference voltage to generate a plurality of initial gamma reference voltages, and a gamma voltage selection unit configured to generate gamma reference voltages by selecting first gamma reference voltages, corresponding to a first color pixel, from among the plurality of initial gamma reference voltages and second gamma reference voltages, corresponding to a second color pixel, from among the plurality of initial gamma reference voltages. Herein, an output part of initial gamma reference voltages selected in common as the first and second gamma reference voltages is shared with input parts of the first and second gamma reference voltages.

Abstract translation: 伽玛电压发生电路包括：伽马电压分配单元，被配置为分配参考电压以产生多个初始伽马参考电压;伽马电压选择单元，被配置为通过选择第一伽马参考电压来产生伽马参考电压，所述伽马参考电压对应于第一 从所述多个初始伽马参考电压之中的多个初始伽马参考电压和对应于第二彩色像​​素的第二伽马参考电压的颜色像素。 这里，作为第一和第二伽马参考电压共同选择的初始伽马参考电压的输出部分与第一和第二伽马参考电压的输入部分共享。

公开(公告)号：US20190385695A1

公开(公告)日：2019-12-19

申请号：US16249543

申请日：2019-01-16

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Changwook JEONG ,  Sanghoon MYUNG ,  Min-Chul PARK ,  Jeonghoon KO ,  Jisu RYU ,  Hyunjae JANG ,  Hyungtae KIM ,  Yunrong LI ,  Min Chul JEON

IPC: G11C29/50 ,  G11C29/48 ,  G11C29/56 ,  G01R31/27 ,  G01R31/26 ,  G01R31/3185 ,  G01R31/30

Abstract: A fault analysis method of a semiconductor fault analysis device is provided. The fault analysis method includes: receiving measurement data measured corresponding to a semiconductor device; generating double sampling data based on the measurement data and reference data; performing a fault analysis operation with respect to the double sampling data; classifying a fault type of the semiconductor device based on a result of the fault analysis operation; and outputting information about the fault type.