公开(公告)号：US20170133071A1

公开(公告)日：2017-05-11

申请号：US15405509

申请日：2017-01-13

Applicant: SK hynix Inc.

Inventor： Cheol Hoe KIM ,  Kyeong Tae KIM

IPC: G11C8/18

CPC classification number: G11C8/18 ,  G11C5/147 ,  G11C8/10 ,  G11C8/12

Abstract: A semiconductor system includes a first semiconductor device configured to output command addresses; and a second semiconductor device configured to generate a first control signal including a pulse controlled in its pulse width in synchronization with a toggling time of a bank active signal for selecting a bank to be activated in an active operation in response to the command addresses, a second control signal enabled in response to the bank active signal, and an internal voltage in response to the first and second control signals.

公开(公告)号：US20250157498A1

公开(公告)日：2025-05-15

申请号：US18437481

申请日：2024-02-09

Applicant: SK hynix Inc.

Inventor： Seon Hong KIM ,  Kyeong Tae KIM

IPC: G11C5/14 ,  G11C7/06

Abstract: A voltage generation circuit includes a voltage control circuit configured to disable a high voltage driving signal, after generating a low voltage driving signal and the high voltage driving signal by comparing a reference voltage and an internal voltage after the start of a mismatching cancellation operation and a sensing operation, and a voltage supply circuit including a first driver having a first driving power and a second driver having a second driving power and configured to drive the internal voltage by selectively activating the first driver and the second driver based on the low voltage driving signal and the high voltage driving signal.

公开(公告)号：US20190086355A1

公开(公告)日：2019-03-21

申请号：US15952870

申请日：2018-04-13

Applicant: SK hynix Inc.

Inventor： Se Hwan KIM ,  Kyeong Tae KIM ,  Jae Boum PARK

IPC: G01N27/22 ,  G01R27/26

Abstract: A semiconductor apparatus may include a capacitance measuring circuit. The capacitance measuring circuit may include a constant current circuit configured to output a constant current. The capacitance measuring circuit may include a voltage converting circuit configured to convert the constant current into a detection voltage, and compensate for a variation of the detection voltage due to internal leakage current of the voltage converting circuit. The capacitance measuring circuit may include a code generating circuit configured to generate a value obtained by detecting a time elapsed while the detection voltage increases to a reference voltage, as a code signal.