公开(公告)号：US20170133071A1

公开(公告)日：2017-05-11

申请号：US15405509

申请日：2017-01-13

Applicant: SK hynix Inc.

Inventor： Cheol Hoe KIM ,  Kyeong Tae KIM

IPC: G11C8/18

CPC classification number: G11C8/18 ,  G11C5/147 ,  G11C8/10 ,  G11C8/12

Abstract: A semiconductor system includes a first semiconductor device configured to output command addresses; and a second semiconductor device configured to generate a first control signal including a pulse controlled in its pulse width in synchronization with a toggling time of a bank active signal for selecting a bank to be activated in an active operation in response to the command addresses, a second control signal enabled in response to the bank active signal, and an internal voltage in response to the first and second control signals.

公开(公告)号：US20190086355A1

公开(公告)日：2019-03-21

申请号：US15952870

申请日：2018-04-13

Applicant: SK hynix Inc.

Inventor： Se Hwan KIM ,  Kyeong Tae KIM ,  Jae Boum PARK

IPC: G01N27/22 ,  G01R27/26

Abstract: A semiconductor apparatus may include a capacitance measuring circuit. The capacitance measuring circuit may include a constant current circuit configured to output a constant current. The capacitance measuring circuit may include a voltage converting circuit configured to convert the constant current into a detection voltage, and compensate for a variation of the detection voltage due to internal leakage current of the voltage converting circuit. The capacitance measuring circuit may include a code generating circuit configured to generate a value obtained by detecting a time elapsed while the detection voltage increases to a reference voltage, as a code signal.