公开(公告)号：US09208040B2

公开(公告)日：2015-12-08

申请号：US14266067

申请日：2014-04-30

Applicant: STMicroelectronics International N.V.

Inventor： Harsh Rawat ,  Kedar Janardan Dhori ,  Vinay Kumar ,  PraveenKumar Verma

IPC: G06F11/00 ,  G06F11/20

CPC classification number: G11C29/702 ,  G06F11/2094 ,  G06F2201/85

Abstract: Repair control logic for a safe memory having redundant elements is provided. The repair control logic includes comparison logic including, for each bit slice of a memory array, a comparator circuit configured to determine whether a location value of an associated bit slice of the memory array is greater than a location value of a defective bit slice of the memory array, and data switching logic including, for each bit slice of the memory array, a switching circuit, responsive to a determination that the location value of the associated bit slice is greater than the location value of the defective bit slice, to switch data from the associated bit slice to an adjacent bit slice of the memory array.

Abstract translation: 提供了具有冗余元件的安全存储器的修复控制逻辑。 修复控制逻辑包括比较逻辑，包括对于存储器阵列的每个位片，比较器电路被配置为确定存储器阵列的关联位片的位置值是否大于存储器阵列的有缺陷位片的位置值 存储器阵列和数据切换逻辑，包括对于存储器阵列的每个位片，响应于相关联的位片的位置值大于缺陷比特片的位置值的确定来切换数据，切换电路 从相关联的位片到存储器阵列的相邻位片。

公开(公告)号：US20150317225A1

公开(公告)日：2015-11-05

申请号：US14266067

申请日：2014-04-30

Applicant: STMicroelectronics International N.V.

Inventor： Harsh Rawat ,  Kedar Janardan Dhori ,  Vinay Kumar ,  PraveenKumar Verma

IPC: G06F11/20

CPC classification number: G11C29/702 ,  G06F11/2094 ,  G06F2201/85

Abstract: Repair control logic for a safe memory having redundant elements is provided. The repair control logic includes comparison logic including, for each bit slice of a memory array, a comparator circuit configured to determine whether a location value of an associated bit slice of the memory array is greater than a location value of a defective bit slice of the memory array, and data switching logic including, for each bit slice of the memory array, a switching circuit, responsive to a determination that the location value of the associated bit slice is greater than the location value of the defective bit slice, to switch data from the associated bit slice to an adjacent bit slice of the memory array.

Abstract translation: 提供了具有冗余元件的安全存储器的修复控制逻辑。 修复控制逻辑包括比较逻辑，包括对于存储器阵列的每个位片，比较器电路被配置为确定存储器阵列的关联位片的位置值是否大于存储器阵列的有缺陷位片的位置值 存储器阵列和数据切换逻辑，包括对于存储器阵列的每个位片，响应于相关联的位片的位置值大于缺陷比特片的位置值的确定来切换数据，切换电路 从相关联的位片到存储器阵列的相邻位片。