公开(公告)号：US12001012B2

公开(公告)日：2024-06-04

申请号：US17238596

申请日：2021-04-23

Applicant: STMicroelectronics S.r.l. ,  STMicroelectronics Ltd

Inventor： Davide Terzi ,  Gianluca Mendicino ,  Dadi Sharon

IPC: G02B26/10 ,  B81B3/00 ,  G02B26/08 ,  G09G3/34 ,  H02N2/10 ,  H02N2/14 ,  H03H9/15 ,  H10N30/20 ,  H10N30/853

CPC classification number: G02B26/101 ,  B81B3/0021 ,  G02B26/0858 ,  G09G3/346 ,  H02N2/103 ,  H02N2/145 ,  H03H9/15 ,  H10N30/204 ,  B81B2201/032 ,  H10N30/8554

Abstract: Disclosed herein is a microelectromechanical (MEMS) device, including a rotor and a first piezoelectric actuator mechanically coupled to the rotor. The first piezoelectric actuator is electrically coupled between a first signal node and a common voltage node. A second piezoelectric actuator is mechanically coupled to the rotor, and is electrically coupled between a second signal node and the common voltage node. Control circuitry includes a drive circuit configured to drive the first and second piezoelectric actuators, a sense circuit configured to process sense signals generated by the first and second pizeoelectric actuators, and a multiplexing circuit. The multiplexing circuit is configured to alternate between connecting the drive circuit to the first piezoelectric actuator while connecting the sense circuit to the second piezoelectric actuator, and connecting the drive circuit to the second piezoelectric actuator while connecting the sense circuit to the first piezoelectric actuator.

公开(公告)号：US12242051B2

公开(公告)日：2025-03-04

申请号：US17745186

申请日：2022-05-16

Applicant: STMicroelectronics S.r.l.

Inventor： Nicolo′ Boni ,  Gianluca Mendicino ,  Enri Duqi ,  Roberto Carminati ,  Massimiliano Merli

IPC: G02B26/08 ,  G01L1/18 ,  H02K11/21

Abstract: A microelectromechanical mirror device has, in a die of semiconductor material: a fixed structure defining a cavity; a tiltable structure carrying a reflecting region elastically suspended above the cavity; at least a first pair of driving arms coupled to the tiltable structure and carrying respective piezoelectric material regions which may be biased to cause a rotation thereof around at least one rotation axis; elastic suspension elements coupling the tiltable structure elastically to the fixed structure and which are stiff with respect to movements out of the horizontal plane and yielding with respect to torsion; and a piezoresistive sensor configured to provide a detection signal indicative of the rotation of the tiltable structure. At least one test structure is integrated in the die to provide a calibration signal indicative of a sensitivity variation of the piezoresistive sensor in order to calibrate the detection signal.