ELECTRONIC CIRCUIT WITH ELECTROSTATIC DISCHARGE PROTECTION

    公开(公告)号:US20200006320A1

    公开(公告)日:2020-01-02

    申请号:US16454230

    申请日:2019-06-27

    Abstract: A semiconductor substrate includes a doped region having an upper surface. The doped region may comprise a conduction terminal of a diode (such as cathode) or a transistor (such as a drain). A silicide layer is provided at the doped region. The silicide layer has an area that only partially covers an area of the upper surface of the doped region. The partial area coverage facilitates modulating the threshold voltage and/or leakage current of an integrated circuit device.

    ELECTRONIC DEVICE OF PROTECTION AGAINST ELECTROSTATIC DISCHARGES

    公开(公告)号:US20190181131A1

    公开(公告)日:2019-06-13

    申请号:US16216541

    申请日:2018-12-11

    Abstract: An electronic device for providing ESD protection is formed by a MOS transistor. the MOS transistor includes a source region and a drain region that are separated from each other by a channel-forming region. A first gate is located over the channel forming region. The drain region includes an extension region. A second gate is located over the extension region. The first and second gates are electrically connected to each other.

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