INTEGRATED CIRCUIT WITH DOUBLE ISOLATION OF DEEP AND SHALLOW TRENCH-ISOLATION TYPE

    公开(公告)号:US20210020660A1

    公开(公告)日:2021-01-21

    申请号:US16927510

    申请日:2020-07-13

    Abstract: A silicon-on-insulator semiconductor substrate supports rows extending in a direction. Each row includes complementary MOS transistors and associated contact regions allowing back gate of the complementary MOS transistors to be biased. All transistors and associated contact regions of a given row are mutually isolated by a first trench isolation. Each row is bordered on opposed edges extending parallel to said direction by corresponding second trench isolations that are shallower than the first trench isolation.

    ELECTRONIC CIRCUIT WITH ELECTROSTATIC DISCHARGE PROTECTION

    公开(公告)号:US20200006320A1

    公开(公告)日:2020-01-02

    申请号:US16454230

    申请日:2019-06-27

    Abstract: A semiconductor substrate includes a doped region having an upper surface. The doped region may comprise a conduction terminal of a diode (such as cathode) or a transistor (such as a drain). A silicide layer is provided at the doped region. The silicide layer has an area that only partially covers an area of the upper surface of the doped region. The partial area coverage facilitates modulating the threshold voltage and/or leakage current of an integrated circuit device.

    INTEGRATED ARTIFICIAL NEURON DEVICE

    公开(公告)号:US20220138530A1

    公开(公告)日:2022-05-05

    申请号:US17572899

    申请日:2022-01-11

    Abstract: An artificial-neuron device includes an integration-generation circuit coupled between an input at which an input signal is received and an output at which an output signal is delivered, and a refractory circuit inhibiting the integrator circuit after the delivery of the output signal. The refractory circuit is formed by a first MOS transistor having a first conduction-terminal coupled to a supply node, a second conduction-terminal coupled to a common node, and a control-terminal coupled to the output, and a second MOS transistor having a first conduction-terminal coupled to the input, a second conduction-terminal coupled to a reference node at which a reference voltage is received, and a control-terminal coupled to the common node. A resistive-capacitive circuit is coupled between the supply node and the reference node and having a tap coupled to the common node, with the inhibition duration being dependent upon a time constant of the resistive-capacitive circuit.

    PROTECTING AN INTEGRATED CIRCUIT FROM THE DRILLING OF A SOURCE AND/OR DRAIN CONTACT

    公开(公告)号:US20210020663A1

    公开(公告)日:2021-01-21

    申请号:US16926128

    申请日:2020-07-10

    Abstract: An integrated circuit includes a MOS transistor that is located in and on a semiconductor film of a silicon-on-insulator (SOI) substrate. The SOI substrate has, below a buried insulator layer, a first back gate region and two first auxiliary regions that are located, respectively, below source and drain contact regions of the MOS transistor. The conductivity type of the two first auxiliary regions is the opposite the conductivity type of the first back gate region. The conductivity type of the two first auxiliary regions is identical to the conductivity type of the source and drain contact regions of the MOS transistor.

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