公开(公告)号：US20070088451A1

公开(公告)日：2007-04-19

申请号：US11545067

申请日：2006-10-06

申请人： Salman Akram ,  Warren Farnworth ,  Derek Gouchnour ,  David Hembree ,  Michael Hess ,  John Jacobson ,  James Wark ,  Alan Wood

发明人： Salman Akram ,  Warren Farnworth ,  Derek Gouchnour ,  David Hembree ,  Michael Hess ,  John Jacobson ,  James Wark ,  Alan Wood

IPC分类号： G06F19/00

CPC分类号： G03F7/7065 ,  G06F11/006 ,  H01L2223/5444

摘要： An inventive method in an integrated circuit (IC) manufacturing process for using data regarding repair procedures conducted on ICs at probe to determine whether any further repairs will be conducted later in the manufacturing process includes storing the data in association with a fuse ID of each of the ICs. The ID codes of the ICs are automatically read, for example, at an opens/shorts test during the manufacturing process. The data stored in association with the ID codes of the ICs is then accessed, and additional repair procedures the ICs may undergo are selected in accordance with the accessed data. Thus, for example, the accessed data may indicate that an IC is unrepairable, so the IC can proceed directly to a scrap bin without having to be queried to determine whether it is repairable, as is necessary in traditional IC manufacturing processes.

摘要翻译： 在集成电路（IC）制造过程中的创造性方法，用于使用关于在探针上的IC进行的修复程序的数据，以确定是否在制造过程中稍后进行进一步的修理，包括将数据与每个的熔丝ID相关联地存储 IC。 IC的ID代码在制造过程中例如在打开/短路测试中自动读取。 然后访问与IC的ID代码相关联存储的数据，并且根据所访问的数据选择IC可能经历的附加修复过程。 因此，例如，访问的数据可以指示IC不可修复，因此IC可以直接进入废料仓，而不必被查询以确定其是否可修复，如在传统IC制造过程中所必需的。