ELECTRONIC DEVICE AND METHOD FOR CONTROLLING PRESSURE INPUT

    公开(公告)号:US20200150828A1

    公开(公告)日:2020-05-14

    申请号:US16614138

    申请日:2018-06-11

    Abstract: An electronic device according to various embodiments of the present invention comprises: a housing including a first plate and a second plate spaced apart from the first plate; a touch screen display disposed inside the housing and exposed through a part of the first plate; a pressure sensing circuit disposed between the first plate and the second plate, and configured to detect pressure caused by an external pressure applied to at least a part of the touch screen display; a wireless communication circuit disposed inside the housing; at least one processor disposed inside the housing and electrically connected to the touch screen display, the pressure sensing circuit, and the wireless communication circuit; and a memory disposed inside the housing and electrically connected to the processor, wherein the memory is configured to store an application program including a user interface and instructions, wherein the instructions are configured to cause the processor to, when executed, display at least one object on the user interface on the touch screen display, detect a pressure level for a user input in the at least one object or in the periphery thereof by using the pressure sensing circuit, and select one of a plurality of operations, related to the at least one object, on the basis of at least one part of the detected pressure level. Other embodiments are also possible.

    AUTOMATED TEST EQUIPMENT AND CONTROL METHOD THEREOF
    3.
    发明申请
    AUTOMATED TEST EQUIPMENT AND CONTROL METHOD THEREOF 有权
    自动测试设备及其控制方法

    公开(公告)号:US20140258778A1

    公开(公告)日:2014-09-11

    申请号:US14197384

    申请日:2014-03-05

    CPC classification number: G06F11/2294

    Abstract: An automated test system for a semiconductor device to concurrently perform multiple device tests is provided. The system may include at least one test client, at least one test site and a test server. The at least one test client is configured to receive a test request of at least one worker and to display a test response. The at least one test site is configured to test at least one device under test (DUT). The test server is configured to communicate with the at least one test client and the at least one test site, divide and/or drive the at least one test site in response to the test request of the at least one test client, and transmit a response of the at least one test site to the at least one test client.

    Abstract translation: 提供了一种用于半导体器件同时执行多个器件测试的自动化测试系统。 该系统可以包括至少一个测试客户端,至少一个测试站点和测试服务器。 所述至少一个测试客户端被配置为接收至少一个工作者的测试请求并显示测试响应。 至少一个测试站点被配置为测试至少一个被测器件(DUT)。 所述测试服务器被配置为与所述至少一个测试客户端和所述至少一个测试站点进行通信,以响应于所述至少一个测试客户端的所述测试请求来划分和/或驱动所述至少一个测试站点,并且发送 所述至少一个测试站点对所述至少一个测试客户端的响应。

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