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公开(公告)号:US20220171658A1
公开(公告)日:2022-06-02
申请号:US17327600
申请日:2021-05-21
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jieun LEE , Jin-Hong KIM , Jaehyung AHN , Sungduk CHO
Abstract: An active scheduling method performed with a master processor and a plurality of slave processors. The method includes determining whether a job to be performed has a dependency by referencing a job queue; in a case in which it is determined that the job to be performed has a dependency, updating a state of the job to be performed in a table in which information of each of a plurality of jobs is recorded; analyzing a state of a job preceding the job to be performed based on the table; and in a case in which the job preceding the job to be performed is determined to have been completed, performing the job to be performed by retrieving the job to be performed from the job queue.
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公开(公告)号:US20240248051A1
公开(公告)日:2024-07-25
申请号:US18458565
申请日:2023-08-30
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jaehyung AHN , Inseok PARK , Joonseo SONG , Souk KIM , Younghoon SOHN
IPC: G01N23/2251 , G06T7/00 , G06T7/80
CPC classification number: G01N23/2251 , G06T7/0004 , G06T7/80 , G01N2223/303 , G01N2223/401 , G01N2223/6116 , G06T2207/10061 , G06T2207/30148
Abstract: A wafer measurement apparatus includes an electronic-optical system configured to irradiate a wafer with an electron beam and acquire a raw signal by detecting electrons emitted by the wafer, and an image processing device configured to convert the raw signal acquired by the electronic-optical system into image data. The electronic-optical system includes a detector configured to acquire the raw signal. The detector calibrates a gain offset using a difference in electron emission yields of different materials.
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公开(公告)号:US20230140892A1
公开(公告)日:2023-05-11
申请号:US17879515
申请日:2022-08-02
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jaehyung AHN , Kwangeun KIM , Souk KIM , Younghoon SOHN
IPC: H01J37/28 , H01J37/22 , H01J37/244
CPC classification number: H01J37/28 , H01J37/226 , H01J37/244
Abstract: A scanning electron microscope (SEM) includes an electron gun, a deflector, an objective lens, first and second detectors each configured to detect emission electrons emitted from the wafer based on the input electron beam being irradiated on the wafer, a first energy filter configured to block electrons having energy less than a first energy among emission electrons emitted from a wafer based on an input electron beam from being detected by the first detector, and a second energy filter configured to block electrons having energy less than second energy among the emission electrons from being detected by the second detector.
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公开(公告)号:US20230076106A1
公开(公告)日:2023-03-09
申请号:US17881793
申请日:2022-08-05
Applicant: Samsung Electronics Co., Ltd.
Inventor: BYUNGWOO BANG , SEONGBEOM KIM , UISEOK SONG , Jaehyung AHN , JUNYEON LEE , WOOSEOK CHANG
Abstract: A method and apparatus with cosmic ray fault protection is included. A method includes obtaining cosmic ray information indicating at least one cosmic ray event, determining a soft error mitigation policy based on the cosmic ray information, accessing the soft error mitigation policy by a device, and based on the soft error mitigation policy, performing, by the device, a mitigation action that mitigates for soft errors related to the cosmic ray event.
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公开(公告)号:US20210191728A1
公开(公告)日:2021-06-24
申请号:US16922073
申请日:2020-07-07
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jaehyung AHN , Wooseok CHANG , Yongha PARK
Abstract: A method of operating an accelerator includes receiving, from a central processing unit (CPU), commands for the accelerator and a peripheral device of the accelerator, processing the received commands according to a subject of performance of each of the commands, and transmitting a completion message indicating that performance of the commands is completed to the CPU after the performance of the commands is completed.
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公开(公告)号:US20220229668A1
公开(公告)日:2022-07-21
申请号:US17717302
申请日:2022-04-11
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jaehyung AHN , Wooseok CHANG , Yongha PARK
Abstract: A method of operating an accelerator includes receiving, from a central processing unit (CPU), commands for the accelerator and a peripheral device of the accelerator, processing the received commands according to a subject of performance of each of the commands, and transmitting a completion message indicating that performance of the commands is completed to the CPU after the performance of the commands is completed.
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公开(公告)号:US20220121912A1
公开(公告)日:2022-04-21
申请号:US17241380
申请日:2021-04-27
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Hyesun HONG , Jaehyung AHN
Abstract: A processor-implemented data processing method includes: receiving a request for executing a neural network model on an accelerator; generating a plurality of candidate kernels for each of a plurality of layers comprised in the model; and allocating, to the accelerator, a single candidate kernel that is selected from among a plurality of candidate kernels for a layer to run on the accelerator based on corresponding kernel information and status information of the accelerator.
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公开(公告)号:US20210256373A1
公开(公告)日:2021-08-19
申请号:US17119197
申请日:2020-12-11
Inventor: Jaehyung AHN , Minsoo RHU , Yujeong CHOI
Abstract: A method of operating the accelerator includes receiving a request for preemption during an execution of a first task using one or more processing elements included in the accelerator, in response to the request for preemption, moving context information of the first task stored in an internal memory of the accelerator to an external memory of the accelerator, and executing a second task associated with the request for preemption using the processing elements.
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