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    METHOD OF GENERATING DEFECT CLASSIFICATION MODEL
    1.
    发明申请
    METHOD OF GENERATING DEFECT CLASSIFICATION MODEL 有权

    公开(公告)号：US20250037486A1

    公开(公告)日：2025-01-30

    申请号：US18668890

    申请日：2024-05-20

    Applicant: SAMSUNG ELECTRONICS CO., LTD.

    Inventor： Jinwoo LEE ,  Bumjoo LEE ,  Jongcheon SUN ,  Suyoung LEE ,  Hyeongcheol LEE

    IPC: G06V20/69 ,  G06T7/00 ,  G06V10/764

    Abstract: A method of generating a defect classification model includes preparing a sample wafer that has undergone at least one unit of a manufacturing process, capturing, using an electronic device, a plurality of primary images of different locations of the sample wafer, obtaining a plurality of secondary images based on the capturing of the plurality of primary images, detecting a plurality of defect images including a defect from among the plurality of primary images and the plurality of secondary images, classifying and labeling at least one of the plurality of defect images as defect data, and generating an automatic defect classification model based on the defect data.

    METHOD OF INSPECTING DEFECTS
    3.
    发明申请
    METHOD OF INSPECTING DEFECTS 有权

    公开(公告)号：US20250014169A1

    公开(公告)日：2025-01-09

    申请号：US18644638

    申请日：2024-04-24

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Bumjoo LEE ,  Jinwoo LEE ,  Suyoung LEE

    IPC: G06T7/00 ,  G06T5/20 ,  G06T5/70 ,  G06T7/11

    Abstract: A defect inspection method includes: recognizing image peaks that are reference positions of image patterns included an inspection image; performing filtering on a reference image including reference patterns, recognizing reference peaks, and then selecting some of the reference peaks as peak samples; calculating candidate correction constants by overlapping the filtered inspection image and the filtered reference image, and then selecting a primary correction constant among the candidate correction constants; applying the first correction constant to the reference image and selecting a secondary correction constant by matching the image peaks to the reference peaks included in a primary corrected reference image, and then applying the secondary correction constant to the primary corrected reference image and forming a secondary corrected reference image aligned with the inspection image; and performing a defect inspection on the inspection image by matching the image patterns to reference patterns included in the secondary corrected reference image.

    IMAGE PROCESSING DEVICE FOR NOISE REDUCTION USING DUAL CONVERSION GAIN AND OPERATION METHOD THEREOF
    4.
    发明申请
    IMAGE PROCESSING DEVICE FOR NOISE REDUCTION USING DUAL CONVERSION GAIN AND OPERATION METHOD THEREOF 有权

    公开(公告)号：US20220417457A1

    公开(公告)日：2022-12-29

    申请号：US17670793

    申请日：2022-02-14

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Daeyoung KIM ,  Kundong KIM ,  Jongwoo KIM ,  Suyoung LEE

    IPC: H04N5/355 ,  H04N5/357

    Abstract: Disclosed is a device for noise reduction using dual conversion gain, which includes an image sensor including a pixel array, the pixel array configured to generate a first pixel signal corresponding to a first conversion gain and a second pixel signal corresponding to a second conversion gain from pixels sharing a floating diffusion region and the image sensor configured to generate first image data and second image data based on the first pixel signal and the second pixel signal, and an image signal processor that generates an output image based on the first image data and the second image data. The image signal processor includes a normalization circuit that normalizes the first image data based on a dynamic range of the second image data to generate third image data, and a blending circuit that generates the output image based on the second image data and the third image data.

    CAMERA MODULE AND IMAGING DEVICE INCLUDING THE SAME
    5.
    发明申请
    CAMERA MODULE AND IMAGING DEVICE INCLUDING THE SAME 有权

    公开(公告)号：US20220360712A1

    公开(公告)日：2022-11-10

    申请号：US17702360

    申请日：2022-03-23

    Applicant: SAMSUNG ELECTRONICS CO., LTD.

    Inventor： Jongwoo KIM ,  Kilwoo CHUNG ,  Daeyoung KIM ,  Suyoung LEE

    IPC: H04N5/232

    Abstract: An imaging device includes a lens module configured to receive an optical signal, an image sensor configured to generate image data based on the received optical signal, a tilting module configured to adjust a position of the image sensor, and a processor configured to control the tilting module based on the image data. The processor is further configured to recognize a target object from the image data and control the tilting module in response to comparing a location of the target object with reference location information including object location information.

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