公开(公告)号：US20160216899A1

公开(公告)日：2016-07-28

申请号：US14959089

申请日：2015-12-04

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jun-bum PARK ,  Ho-jun SHIM

IPC: G06F3/06

CPC classification number: G06F3/0616 ,  G06F3/061 ,  G06F3/0634 ,  G06F3/0653 ,  G06F3/0655 ,  G06F3/0679 ,  G06F3/0688 ,  G06F12/0246

Abstract: Semiconductor storage devices and methods of operating the same are provided. The semiconductor storage device including a non-volatile memory device, and a memory controller configured to control the non-volatile memory device, the memory controller including a performance control module, the performance control module configured to control a performance level of the memory controller based on state information of the memory controller may be provided.

Abstract translation: 提供了半导体存储装置及其操作方法。 包括非易失性存储器件的半导体存储器件和配置成控制非易失性存储器件的存储器控​​制器，所述存储器控制器包括性能控制模块，所述性能控制模块被配置为控制所述存储器控制器的性能水平 可以提供存储器控制器的开启状态信息。

公开(公告)号：US20170352599A1

公开(公告)日：2017-12-07

申请号：US15429525

申请日：2017-02-10

Applicant: Samsung Electronics Co.,Ltd.

Inventor： Jun-bum PARK ,  Kyung-sik KANG ,  Byeong-hwan JEON ,  Jae-chol JOO ,  Tae-joong KIM

IPC: H01L21/66 ,  G01N21/95 ,  G01N21/956 ,  G01J3/42 ,  H01L21/3205 ,  G01N21/27 ,  G01N21/25 ,  G01J3/28

Abstract: Manufacturing a device may include inspecting a surface of an inspection target device. The inspecting may include forming a metal layer on a surface of the inspection target device on which a minute pattern is formed, directing a beam of light to be incident and normal to the surface of the inspection target device, determining a spectrum of light reflected from the surface of the inspection target device, and generating, via the spectrum, information associated with a structural characteristic of the minute pattern formed on the inspection target device. The inspection target device may be selectively incorporated into the manufactured device based on the generated information.