公开(公告)号：US5402072A

公开(公告)日：1995-03-28

申请号：US843672

申请日：1992-02-28

申请人： Shinwu Chiang ,  Huntington W. Curtis ,  Arthur E. Falls ,  Arnold Halperin ,  John P. Karidis ,  John D. Mackay ,  Danny C. Wong ,  Ka-Chiu Woo ,  Li-Cheng Zai

发明人： Shinwu Chiang ,  Huntington W. Curtis ,  Arthur E. Falls ,  Arnold Halperin ,  John P. Karidis ,  John D. Mackay ,  Danny C. Wong ,  Ka-Chiu Woo ,  Li-Cheng Zai

IPC分类号： G01R31/02 ,  G01R31/28 ,  G01R27/26

CPC分类号： G01R31/2805

摘要： Apparatus and method are disclosed for performing testing and fault isolation of high density passive boards (e.g. unpopulated circuit boards) and substrates. Using a small number of moving probes, simultaneous network resistance and network capacitance measurements may be performed. Thus, test time is minimized by eliminating the need for electrical switching and/or excessive probe movement during the test of a normal circuit board network. Simultaneous network capacitance and network leakage measurement are also achieved using phase-sensitive detection. Dual-frequency measurement techniques allow the measurement of both the capacitance value and resistance value of a leakage path between a network being measured and an unknown network. Any leakage resistance between a network under test and ground or power planes within the circuit board may also be determined from the measurements. Simultaneous independent net-to-plane capacitance characterization is also achieved using signals of mutually independent frequencies accompanied by minimal signal processing. Thus, improved defect detection capabilities are obtained.

摘要翻译： 公开了用于执行高密度无源板（例如未填充的电路板）和衬底的测试和故障隔离的装置和方法。 使用少量移动探头，可以执行同时的网络电阻和网络电容测量。 因此，在普通电路板网络的测试期间，通过消除电气切换和/或过度的探头移动的需要来最小化测试时间。 使用相敏检测也可以实现网络电容和网络泄漏测量。 双频测量技术允许测量被测网络与未知网络之间的泄漏路径的电容值和电阻值。 被测网络和电路板内的接地或电源层之间的任何漏电阻也可以从测量中确定。 使用相互独立的频率的信号伴随着最小的信号处理也实现了同时独立的网络到平面电容表征。 因此，获得了改进的缺陷检测能力。

公开(公告)号：US5621327A

公开(公告)日：1997-04-15

申请号：US409743

申请日：1995-03-24

申请人： Shinwu Chiang ,  Huntington W. Curtis ,  Arthur E. Falls ,  Arnold Halperin ,  John P. Karidis ,  John D. Mackay ,  Danny C.-Y. Wong ,  Ka-Chiu Woo ,  Li-Cheng Zai

发明人： Shinwu Chiang ,  Huntington W. Curtis ,  Arthur E. Falls ,  Arnold Halperin ,  John P. Karidis ,  John D. Mackay ,  Danny C.-Y. Wong ,  Ka-Chiu Woo ,  Li-Cheng Zai

IPC分类号： G01R31/02 ,  G01R31/28 ,  G01R27/26

CPC分类号： G01R31/2805

摘要： Apparatus and method are disclosed for performing testing and fault isolation of high density passive boards and substrates. Using a small number of moving probes, simultaneous network resistance and network capacitance measurements may be performed. Thus, test time is minimized by eliminating the need for electrical switching and/or excessive probe movement during the test of a normal circuit board network. Simultaneous network capacitance and network leakage measurement are also achieved using phase-sensitive detection. Dual-frequency measurement techniques allow the measurement of both the capacitance value and resistance value of a leakage path between a network being measured and an unknown network. Any leakage resistance between a network under test and ground or power planes within the circuit board may also be determined from the measurements. Simultaneous independent net-to-plane capacitance characterization is also achieved using signals of mutually independent frequencies accompanied by minimal signal processing. Thus, improved defect detection capabilities are obtained.

摘要翻译： 公开了用于执行高密度无源板和衬底的测试和故障隔离的装置和方法。 使用少量移动探头，可以执行同时的网络电阻和网络电容测量。 因此，在普通电路板网络的测试期间，通过消除电气切换和/或过度的探头移动的需要来最小化测试时间。 使用相敏检测也可以实现网络电容和网络泄漏测量。 双频测量技术允许测量被测网络与未知网络之间的泄漏路径的电容值和电阻值。 被测网络和电路板内的接地或电源层之间的任何漏电阻也可以从测量中确定。 使用相互独立的频率的信号伴随着最小的信号处理也实现了同时独立的网络到平面电容表征。 因此，获得了改进的缺陷检测能力。

公开(公告)号：US4868506A

公开(公告)日：1989-09-19

申请号：US279482

申请日：1988-12-02

申请人： Thomas H. DiStefano ,  Arthur E. Falls ,  Arnold Halperin ,  John D. Mackay

发明人： Thomas H. DiStefano ,  Arthur E. Falls ,  Arnold Halperin ,  John D. Mackay

IPC分类号： G01R31/02 ,  G01R31/28 ,  G01R33/02 ,  H01L21/66

CPC分类号： G01R31/2805 ,  G01R31/026

摘要： In order to test conductors on substrates for current constricting defects, such as cracks, narrow conductors, line breaks and intermittent opens, a test signal combining two alternating current signals at different frequencies and direct current offset signal is applied to the conductor. Upon encountering a defect, intermodulation signals are generated and detected. The phase of the detected signal and the phase of a reference signal are compared. The difference between the phase of the two signals is indicative of the presence of a defect in the conductor. The invention has particular application for testing thin conductors.