摘要:
Apparatus and method are disclosed for performing testing and fault isolation of high density passive boards and substrates. Using a small number of moving probes, simultaneous network resistance and network capacitance measurements may be performed. Thus, test time is minimized by eliminating the need for electrical switching and/or excessive probe movement during the test of a normal circuit board network. Simultaneous network capacitance and network leakage measurement are also achieved using phase-sensitive detection. Dual-frequency measurement techniques allow the measurement of both the capacitance value and resistance value of a leakage path between a network being measured and an unknown network. Any leakage resistance between a network under test and ground or power planes within the circuit board may also be determined from the measurements. Simultaneous independent net-to-plane capacitance characterization is also achieved using signals of mutually independent frequencies accompanied by minimal signal processing. Thus, improved defect detection capabilities are obtained.
摘要:
A combination radio (10) is provided for enabling the user to listen to two independent radio stations at one time. Alternatively, the combination radio (10) can be tuned into the same radio frequency to allow the user to combine the sound output from each individual radio. Moreover, additional radios can be added to the combination radio to increase the sound output of the system.
摘要:
Apparatus and method for measuring a change in the height of a surface or the distance between two surfaces. The invention involves converging a light beam having a beam axis and a focus onto the said surface; scanning the focus of the light beam across the surface along the beam axis using a scanning means; measuring intensity of light reflected from the surface during the scanning; determining a maximum of the light intensity; assigning to the maximum of the light intensity a position of the scanning means; repeating these steps to monitor a change in the position of the scanning means assigned to the maximum of the light intensity; and correlating such change in the position of the scanning means to a change in the height of the surface.