Method of operating a split gate flash memory cell with coupling gate
    1.
    发明授权
    Method of operating a split gate flash memory cell with coupling gate 有权
    操作具有耦合栅极的分离栅极闪存单元的方法

    公开(公告)号:US09245638B2

    公开(公告)日:2016-01-26

    申请号:US14216776

    申请日:2014-03-17

    CPC classification number: G11C16/26 G11C16/0433 G11C16/14 H01L27/115

    Abstract: A method of operating a memory cell that comprises first and second regions spaced apart in a substrate with a channel region therebetween, a floating gate disposed over the channel region and the fir region, a control gate disposed over the channel region and laterally adjacent to the floating gate with a portion disposed over the floating gate, and a coupling gate disposed over the first region and laterally adjacent to the floating gate. A method of erasing the memory cell includes applying a positive voltage to the control gate and a negative voltage to the coupling gate. A method of reading the memory cell includes applying positive voltages to the control gate, to the coupling gate, and to one of the first and second regions.

    Abstract translation: 一种操作存储单元的方法,所述存储单元包括在衬底中间隔开的沟道区域中的第一和第二区域,设置在所述沟道区域和所述冷杉区域上方的浮置栅极,设置在所述沟道区域上方且横向邻近 浮动栅极,其具有设置在浮置栅极上的部分,以及耦合栅极,设置在第一区域上并且横向邻近浮动栅极。 擦除存储单元的方法包括向控制栅极施加正电压,向耦合栅极施加负电压。 读取存储单元的方法包括向控制栅极,耦合栅极以及第一和第二区域之一施加正电压。

    Method Of Operating A Split Gate Flash Memory Cell With Coupling Gate
    2.
    发明申请
    Method Of Operating A Split Gate Flash Memory Cell With Coupling Gate 有权
    使用耦合栅极操作分离栅极闪存单元的方法

    公开(公告)号:US20140198578A1

    公开(公告)日:2014-07-17

    申请号:US14216776

    申请日:2014-03-17

    CPC classification number: G11C16/26 G11C16/0433 G11C16/14 H01L27/115

    Abstract: A method of operating a memory cell that comprises first and second regions spaced apart in a substrate with a channel region therebetween, a floating gate disposed over the channel region and the first region, a control gate disposed over the channel region and laterally adjacent to the floating gate with a portion disposed over the floating gate, and a coupling gate disposed over the first region and laterally adjacent to the floating gate. A method of erasing the memory cell includes applying a positive voltage to the control gate and a negative voltage to the coupling gate. A method of reading the memory cell includes applying positive voltages to the control gate, to the coupling gate, and to one of the first and second regions.

    Abstract translation: 一种操作存储单元的方法,所述存储单元包括在衬底中间隔开的沟道区域的第一和第二区域,设置在所述沟道区域和所述第一区域上方的浮置栅极,设置在所述沟道区域上并横向邻近所述第二区域的方法 浮动栅极,其具有设置在浮置栅极上的部分,以及耦合栅极,设置在第一区域上并且横向邻近浮动栅极。 擦除存储单元的方法包括向控制栅极施加正电压,向耦合栅极施加负电压。 读取存储单元的方法包括向控制栅极,耦合栅极以及第一和第二区域之一施加正电压。

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