COMPARISON CIRCUIT, ANALOG-TO-DIGITAL CONVERTER CIRCUIT, AND SEMICONDUCTOR INTEGRATED CIRCUIT

    公开(公告)号:US20240120936A1

    公开(公告)日:2024-04-11

    申请号:US18473823

    申请日:2023-09-25

    Applicant: Socionext Inc.

    Inventor: Hidetaka HANEDA

    CPC classification number: H03M1/462 H03M1/466

    Abstract: In an AD converter circuit, a comparison circuit includes: a differential comparison circuit configured to perform comparison determination of differential input signals based on an internal clock signal and generate first differential output signals indicating a determination result; a determination assist circuit configured to receive the first differential output signals and generate second differential output signals; a latch circuit configured to hold the second differential output signals and generate third differential output signals; and a clock generation circuit configured to generate the internal clock signal based on the third differential output signals. The determination assist circuit varies a value of the first differential output signals and generate the second differential output signals when a designed time has elapsed with values of the first differential output signals being unvaried from a reset value since the start of an operation of the comparison determination in the differential comparison circuit.

    ANALOG-TO-DIGITAL CONVERTER CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT

    公开(公告)号:US20230261663A1

    公开(公告)日:2023-08-17

    申请号:US18102454

    申请日:2023-01-27

    Applicant: Socionext Inc.

    CPC classification number: H03M1/0604

    Abstract: An analog-to-digital converter circuit includes: a reference voltage node configured to be supplied with a reference voltage; an analog-to-digital converter circuit unit including a reference voltage input node configured to be electrically connected to the reference voltage node, the reference voltage being input to the reference voltage input node, the analog-to-digital converter circuit unit configured to convert an input analog voltage into a digital value based on the reference voltage; a voltage generation circuit configured to be electrically connected to the reference voltage node and generate an internal operating voltage based on the reference voltage; and a charge compensation circuit configured to operate based on the internal operating voltage, and during operation of the analog-to-digital converter circuit unit, the charge compensation circuit configured to compensate the reference voltage input node for charge.

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