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公开(公告)号:US20220287795A1
公开(公告)日:2022-09-15
申请号:US17829584
申请日:2022-06-01
Applicant: TOPPAN INC.
Inventor: Saeko NOMURA , Junya TANABE , Ryohei TODE , Tsukasa YAMAZAKI
Abstract: An adhesive supplementary marker that is configured to be used together with an adhesive examination marker to be attached to an examination target of image diagnosis using microwaves, and that is configured to be disposed between the adhesive examination marker and the examination target and pressed toward the examination target by the adhesive examination marker in a state in which the adhesive examination marker is attached to the examination target. The adhesive supplementary marker includes a laminate including a base film having a thickness of 20 μm or less, and a pressure-sensitive adhesive layer configured to be attached to the examination target. The base film has a Young's modulus of 1.0 GPa or more.
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公开(公告)号:US20240050190A1
公开(公告)日:2024-02-15
申请号:US18384839
申请日:2023-10-28
Applicant: TOPPAN INC.
Inventor: Saeko NOMURA , Ryo SHODA , Junya TANABE
IPC: A61B90/00
CPC classification number: A61B90/39 , A61B2090/397 , A61B2090/3908 , A61B2090/3991
Abstract: An examination marker for use in diagnostic imaging using microwaves. The examination marker includes a marker main body to be attached to an examination target. The marker main body is capable of displaying, on the marker main body, an index for use in scanning the examination target marker and is deformable following the shape of the examination target. The marker main body has a relative permittivity of 10 or less to microwaves at a frequency of 1 GHz.
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