摘要:
A method for analyzing a solid specimen comprises the steps of: preparing a pulsed laser beam having a frequency of at least 100 Hz and a half width of 1 .mu.sec or less; determining a laser irradiation region; irradiating the pulsed laser beam in an inert gas stream and vaporizing a part of the solid specimen to generate fine particles; transferring said fine particles to a detector; and performing elemental analysis in the detector. An apparatus comprises: laser oscillating device including a semiconductor laser; converging device for converging a laser beam; irradiating device for irradiating the converged laser beam to generate fine particles; an analyzer for performing elemental analysis; and transfer device for transferring the fine particles to said analyzer.
摘要:
A method for detecting a cause of an abnormal portion present on a surface of a steel product, which comprises the steps of: condensing a pulsed laser beam, irradiating the pulsed laser beam thus condensed onto an abnormal portion present on a surface of a steel product and a vicinity thereof, limiting pulse energy density of the pulsed laser beam at an irradiation point of the pulsed laser beam on the surface of the steel product within a range of from 10 kW/mm.sup.2 to 100 MW/mm.sup.2 ; causing the irradiation point of the pulsed laser beam to zigzag-move throughout the entire region containing the abnormal portion and the vicinity thereof, to vaporize a surface portion of the steel product in the zigzag-moving region of the irradiation point, and converting the resultant vapor into fine particles, so as to collect samples of the abnormal portion and the vicinity thereof on the surface of the steel product in the form of fine particles; and continuously analyzing chemical compositions of the thus collected samples in the form of fine particles to detect a cause of an abnormal portion present on the surface of the steel product.
摘要:
A method for analyzing solid sample comprises the steps of: introducing an inert carrier gas into a cell; a preliminary treatment step of irradiating laser beam to a sample surface of the solid sample in the inert carrier gas, the laser beam having a pulse half width of 0.001 .mu.sec or more, a pulse energy density of 0.001 GW/cm.sup.2 or more, and a frequency of 100 Hz or more; generating fine particles in the inert carrier gas on a condition that a rate of fine particles generation, V (.mu.g/sec), and selection ratio, S, satisfy the following equations, the selection ratio being a retio of a concentration of a target element for analysis within the fine particles to a concentration of the target element for analysis within the solid sample;S.ltoreq.0.25 log V+1.5,S.gtoreq.-0.2 log V+0.6,0.1.ltoreq.V.ltoreq.100intoducing the generated fine particles to a detector.
摘要翻译:用于分析固体样品的方法包括以下步骤:将惰性载气引入到电池中; 将惰性载气中的固体样品的样品表面照射激光的预处理步骤,脉冲半宽度为0.001μsec以上,脉冲能量密度为0.001GW / cm 2以上的激光,以及 频率为100Hz以上; 在微细生成速度V(μg/ sec)和选择比S满足下列等式的条件下,在惰性载气中产生细颗粒,选择比为目标浓度 在细颗粒内分析用于在固体样品中分析的目标元素的浓度的元素; S = 0.25log V + 1.5,S> / = -0.2log V + 0.6,0.1 = 100将所产生的细颗粒导入检测器。
摘要:
A method for analyzing steel which comprises: grinding an analysis area of a steel ingot; sealing the analysis area with a sealing section of a cell for generating fine particles; again grinding the analysis area, while an argon gas is introduced into the cell; irradiating a pulsed laser beam of 10.sup.8 W/cm.sup.2 or more onto the analysis area at an irradiating spot of at least 1 mm.sup.2 to generate the fine particles; moving the irradiating spot; and transferring the generated fine particles by the argon gas to a plasma emission analysis for analysis. A further method for analyzing steel comprises: solidifying a molten steel sample, forming a red-hot sample; putting the sample into a sample holding section of a sample chamber under a purified argon gas atmosphere, the sample holding section having an inner curved surface the same as a curved surface of the sample; irradiating a pulsed laser onto the sample to remove a sample surface layer of 25 .mu.m or more of the sample and to generate fine particles from the sample; and exciting the fine particles by a plasma emission analyzer to analyze the composition of the fine particles.