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公开(公告)号:US20180006038A1
公开(公告)日:2018-01-04
申请号:US15682558
申请日:2017-08-22
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Shu-Wei Yeh , Tsung-Hsun Wu , Chih-Ming Su , Zhi-Xian Chou
IPC: H01L27/11 , G11C11/412 , H01L27/02 , H01L29/78
CPC classification number: H01L27/1104 , G11C11/412 , H01L27/0207 , H01L28/00 , H01L29/785
Abstract: A layout pattern of a static random access memory includes a pull-up device, a first pull-down device, a second pull-up device, a second pull-down device, a first pass gate device, a second pass gate device, a third pass gate device and a fourth pass gate device disposed on a substrate. A plurality of fin structures is disposed on the substrate, the fin structures including at least one first fin structure and at least one second fin structure. A step-shaped structure is disposed on the substrate, including a first part, a second part and a bridge part. A first extending contact feature crosses over the at least one first fin structure and the at least one second fin structure.
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公开(公告)号:US09780099B1
公开(公告)日:2017-10-03
申请号:US15233961
申请日:2016-08-11
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Shu-Wei Yeh , Tsung-Hsun Wu , Chih-Ming Su , Zhi-Xian Chou
IPC: G11C11/04 , H01L27/11 , H01L29/78 , H01L27/02 , G11C11/412
CPC classification number: H01L27/1104 , G11C11/412 , H01L27/0207 , H01L28/00 , H01L29/785
Abstract: A layout pattern of a static random access memory includes a pull-up device, a first pull-down device, a second pull-up device, a second pull-down device, a first pass gate device, a second pass gate device, a third pass gate device and a fourth pass gate device disposed on a substrate. A plurality of fin structures is disposed on the substrate, the fin structures including at least one first fin structure and at least one second fin structure. A step-shaped structure is disposed on the substrate, including a first part, a second part and a bridge part. A first extending contact feature crosses over the at least one first fin structure and the at least one second fin structure.
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