公开(公告)号：US20240159794A1

公开(公告)日：2024-05-16

申请号：US18218029

申请日：2023-07-04

Applicant: okins electronics Co.,Ltd

Inventor： Jin Kook JUN ,  Chan Ho Lee ,  Jae Hyun SEO

IPC: G01R1/04 ,  G01R31/28

CPC classification number: G01R1/0466 ,  G01R31/2886

Abstract: A test socket is provided. According to an aspect of the present invention, provided is a test socket energizably connected to a semiconductor device to electrically test the semiconductor device, the test socket including a base on which a seating part on which the semiconductor device is seated is formed and a test pin protruding from the seating part in one direction, the test pin contactable with a conductive part of the semiconductor device; a cover capable of reciprocating a first position located at an end of the base in one direction and a second position located apart from the first position in the one direction; and a support member coupled to the base and supporting an outer surface of the cover.